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A Method-Level Defect Prediction Approach Based on Structural Features of Method-Calling Network | IEEE Journals & Magazine | IEEE Xplore

A Method-Level Defect Prediction Approach Based on Structural Features of Method-Calling Network


The figure shows the overall framework of our approach, which illustrates the whole process of extracting structural features from the method-calling network and combinin...

Abstract:

Software defect prediction models help testers find program modules that have a high probability of having defects. A method-calling network can express the dependencies ...Show More

Abstract:

Software defect prediction models help testers find program modules that have a high probability of having defects. A method-calling network can express the dependencies between methods in a program. Existing approaches do not sufficiently utilize method-calling network to characterize the structural features between methods. To address this problem, in this study, it is proposed for the first time that the characteristics of methods in a program are obtained by analyzing the method-calling network, and a new approach is proposed for defect prediction at the method-level. Specifically in this study, the method-calling network of the program was first constructed and the network metrics of the method-calling network were obtained. Next, the new network embedding technique (node2vec) was used to automatically encode the method-calling network structure into a low-dimensional vector to obtain the network embedding metrics. Finally, they were combined with code metrics to construct defect prediction models. We evaluated our approaches on 13 open-source software systems. The experimental results show that the proposed method improved the values of area under the receiver operating characteristic curve by 2.5% to 6.7% and Matthews correlation coefficient by 13% to 178.4% compared to the baselines. Therefore the method-calling network contains rich structural features between methods, and the structural features extend the features used for method-level defect prediction and further improve the performance of defect prediction models.
The figure shows the overall framework of our approach, which illustrates the whole process of extracting structural features from the method-calling network and combinin...
Published in: IEEE Access ( Volume: 11)
Page(s): 7933 - 7946
Date of Publication: 23 January 2023
Electronic ISSN: 2169-3536

Funding Agency:


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