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BOOM-a heuristic Boolean minimizer | IEEE Conference Publication | IEEE Xplore

BOOM-a heuristic Boolean minimizer


Abstract:

We present a two-level Boolean minimization tool (BOOM) based on a new implicant generation paradigm. In contrast to all previous minimization methods, where the implican...Show More

Abstract:

We present a two-level Boolean minimization tool (BOOM) based on a new implicant generation paradigm. In contrast to all previous minimization methods, where the implicants are generated bottom-up, the proposed method uses a top-down approach. Thus instead of increasing the dimensionality of implicants by omitting literals from their terms, the dimension of a term is gradually decreased by adding new literals. Unlike most other minimization tools like ESPRESSO, BOOM does not use the definition of the function to be minimized as a basis for the solution, and thus the original coverage influences the solution only indirectly through the number of literals used. Most minimization methods use two basic phases introduced by Quine-McCluskey, known as prime implicant (PI) generation and the covering problem solution. Some more modern methods, like ESPRESSO, combine these two phases, reducing the number of PIs to be processed. This approach is also used in BOOM, where the search for new literals to be included into a term aims at maximum coverage of the output function. The function to be minimized is defined by its on-set and off-set, listed in a truth table. Thus the don't care set, often representing the dominant part of the truth table, need not be specified explicitly. The proposed minimization method is efficient above all for functions with a large number of input variables while only few care terms are defined. The minimization procedure is very fast, hence if the first solution does not meet the requirements, it can be improved in an iterative manner. The method has been tested on several different kinds of problems, like the MCNC standard benchmarks or larger problems generated randomly.
Date of Conference: 04-08 November 2001
Date Added to IEEE Xplore: 07 August 2002
Print ISBN:0-7803-7247-6
Print ISSN: 1092-3152
Conference Location: San Jose, CA, USA

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