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Ultra-Low Power, Emission Gate Driver With Pulse Width Modulation Using Low-Temperature Poly-Si Oxide Thin-Film Transistors | IEEE Journals & Magazine | IEEE Xplore

Ultra-Low Power, Emission Gate Driver With Pulse Width Modulation Using Low-Temperature Poly-Si Oxide Thin-Film Transistors


Abstract:

We report a novel emission gate driver using low- temperature poly-Si oxide (LTPO) thin-film transistors (TFTs). The proposed circuit consists of eight p-type low-tempera...Show More

Abstract:

We report a novel emission gate driver using low- temperature poly-Si oxide (LTPO) thin-film transistors (TFTs). The proposed circuit consists of eight p-type low-temperature poly-Si (LTPS) and four n-type amorphous InGaZnO (a-IGZO) TFTs. The output pulse width is adjustable by changing the position of starting control signal which has constant pulse width without additional clock signals. The emission gate driver releases the output signals with various duty ratios. Excellent gate driving performance is achieved from the LTPO emission gate driver, although the a-IGZO TFTs have the threshold voltage of −5.5 V. In addition, the power consumption is as low as 5.98 mW in case of 80 \boldsymbol {\mu }\text{s} pulse, 10 times of gate pulse, at refresh rate of 120 Hz with full high-definition ( 1920\times1080 ) for active-matrix organic light- emitting diode (AMOLED) display.
Published in: IEEE Electron Device Letters ( Volume: 43, Issue: 2, February 2022)
Page(s): 236 - 239
Date of Publication: 21 December 2021

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