Abstract:
In this review paper, we summarize the key distinguishing characteristics and sources of the three primary radiation mechanisms responsible for inducing soft errors in se...Show MoreMetadata
Abstract:
In this review paper, we summarize the key distinguishing characteristics and sources of the three primary radiation mechanisms responsible for inducing soft errors in semiconductor devices and discuss methods useful for reducing the impact of the effects in final packaged parts.
Published in: IEEE Transactions on Device and Materials Reliability ( Volume: 1, Issue: 1, March 2001)
DOI: 10.1109/7298.946456