AUTOCON-IoT: Automated and Scalable Online Conformance Testing for IoT Applications | IEEE Journals & Magazine | IEEE Xplore

AUTOCON-IoT: Automated and Scalable Online Conformance Testing for IoT Applications


In attached figure, the finite state machine of AUTOCON-IoT showing automatic conformance testing for IoT application is described. AUTOCON-IoT, a newly developed testing...

Abstract:

As the Internet of Things (IoT) is evolving rapidly in various verticals, such as smart cities and smart industries, the number of IoT applications is growing exponential...Show More

Abstract:

As the Internet of Things (IoT) is evolving rapidly in various verticals, such as smart cities and smart industries, the number of IoT applications is growing exponentially. Standardized conformance testing mechanisms are widely used to test software applications, including IoT applications. However, current conformance testing mechanisms require continuous human intervention and additional software to be embedded into a target device being tested, which is time consuming, costly, and requires additional memory on the target device. Therefore, there is a considerable need to enhance and optimize existing conformance testing so that it is adequate for automatically testing highly distributed constraint IoT applications. In this paper, we propose a novel mechanism for automated and scalable conformance testing for IoT applications by introducing a test triggering mechanism based on a standardized test interface. This triggering mechanism is based on several new logical components in a testing environment that exchange messages between a testing system and a target IoT device. This technique of automatic conformance testing can lessen the cost and human intercession to decrease the number of missteps and accelerate the IoT market by certifying IoT applications.
In attached figure, the finite state machine of AUTOCON-IoT showing automatic conformance testing for IoT application is described. AUTOCON-IoT, a newly developed testing...
Published in: IEEE Access ( Volume: 8)
Page(s): 43111 - 43121
Date of Publication: 27 February 2020
Electronic ISSN: 2169-3536

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