Abstract:
Crosstalk noise due to the electromagnetic coupling between wires adversely affects VLSI circuit performance. This makes interconnect testing an important issue in reliab...Show MoreMetadata
Abstract:
Crosstalk noise due to the electromagnetic coupling between wires adversely affects VLSI circuit performance. This makes interconnect testing an important issue in reliability evaluation that causes extra area and hardware overhead. In this paper, we present a novel test methodology that we refer to as Test Adapted Shielding (TAS) in order to improve testing challenges and also to optimize crosstalk noise. The test structure of TAS is designed to improve circuit performance by insertion of modified shield lines. The developed hardware for test data is smart enough to avoid aggregation over victim lines in crosstalk. Besides, the TAS test methodology is optimized in power consumption, complexity, fault occurrence, and fault detection. The proposed technique is implemented in HSPICE and MATLAB and the extracted results are used to evaluate its functionality. We show that crosstalk noise is decreased by about 49% and test coverage is 100% for negative and positive glitches.
Published in: 2019 IEEE European Test Symposium (ETS)
Date of Conference: 27-31 May 2019
Date Added to IEEE Xplore: 08 August 2019
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