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550 °C 4H-SiC p-i-n Photodiode Array With Two-Layer Metallization | IEEE Journals & Magazine | IEEE Xplore

550 °C 4H-SiC p-i-n Photodiode Array With Two-Layer Metallization


Abstract:

The p-i-n ultraviolet (UV) photodiodes based on 4H-SiC have been fabricated and characterized from room temperature (RT) to 550 °C. Due to bandgap narrowing at higher tem...Show More

Abstract:

The p-i-n ultraviolet (UV) photodiodes based on 4H-SiC have been fabricated and characterized from room temperature (RT) to 550 °C. Due to bandgap narrowing at higher temperatures, the photocurrent of the photodiode increases by 9 times at 365 nm and reduces by 2.6 times at 275 nm from RT to 550 °C. Moreover, a 4H-SiC p-i-n photodiode array has been fabricated. Each column and row of the array is separately connected by two-layer metallization.
Published in: IEEE Electron Device Letters ( Volume: 37, Issue: 12, December 2016)
Page(s): 1594 - 1596
Date of Publication: 18 October 2016

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