Loading [MathJax]/extensions/MathZoom.js
Terahertz Quantitative Nondestructive Evaluation of Failure Modes in Polymer-Coated Steel | IEEE Journals & Magazine | IEEE Xplore

Terahertz Quantitative Nondestructive Evaluation of Failure Modes in Polymer-Coated Steel


Abstract:

Terahertz reflective imaging is applied to characterize the failure modes in a polymer coating on a steel plate. The coating was initially scratched, then after accelerat...Show More

Abstract:

Terahertz reflective imaging is applied to characterize the failure modes in a polymer coating on a steel plate. The coating was initially scratched, then after accelerated aging, several types of failure have occurred. In order to resolve the thin coating (~50 μm), terahertz frequency-wavelet domain deconvolution is implemented. With the deconvolved signals, the temporally overlapping echoes of the incident, roughly single-cycle terahertz pulse are clearly resolved, and three important failure modes, viz. corrosion, delamination, and blistering, are characterized quantitatively. Terahertz images in three dimensions clearly exhibit the coating thickness distribution across the entire damaged coating, highlighting the terahertz features associated with different failure modes, thus demonstrating that terahertz imaging can be considered as an effective modality for characterizing damage mechanisms in polymer coatings on metals.
Published in: IEEE Journal of Selected Topics in Quantum Electronics ( Volume: 23, Issue: 4, July-Aug. 2017)
Article Sequence Number: 8400207
Date of Publication: 20 September 2016

ISSN Information:

Funding Agency:

Author image of Junliang Dong
School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA
UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, Metz, France
Junliang Dong (S’16) received the M.S. degree in control science and engineering from Tsinghua University, Beijing, China, in 2011. He is currently working toward the Ph.D. degree at Georgia Institute of Technology, Atlanta, GA, USA. His research interests include terahertz imaging and spectroscopy, terahertz optics, and nondestructive testing.
Junliang Dong (S’16) received the M.S. degree in control science and engineering from Tsinghua University, Beijing, China, in 2011. He is currently working toward the Ph.D. degree at Georgia Institute of Technology, Atlanta, GA, USA. His research interests include terahertz imaging and spectroscopy, terahertz optics, and nondestructive testing.View more
Author image of Alexandre Locquet
School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA
UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, Metz, France
Alexandre Locquet received the M.S. degree in electrical engineering from the Faculté Polytechnique de Mons, Mons, Belgium, the Ph.D. degree (doctorat) in engineering science, and electrical and computer engineering from the Université de Franche-Comté, Besançon, France, and the Ph.D. degree in electrical and computer engineering from the Georgia Institute of Technology (Georgia Tech), Atlanta, GA, USA. He is currentl...Show More
Alexandre Locquet received the M.S. degree in electrical engineering from the Faculté Polytechnique de Mons, Mons, Belgium, the Ph.D. degree (doctorat) in engineering science, and electrical and computer engineering from the Université de Franche-Comté, Besançon, France, and the Ph.D. degree in electrical and computer engineering from the Georgia Institute of Technology (Georgia Tech), Atlanta, GA, USA. He is currentl...View more
Author image of D. S. Citrin
School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA
UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, Metz, France
D. S. Citrin (M’93–SM’03) received the B.A. degree from Williams College, Williamstown, MA, USA, in 1985, and the M.S. and Ph.D. degrees from the University of Illinois Champaign, IL, USA, in 1987 and 1991, respectively, all in physics. From 1992 to 1993, he was a Postdoctoral Research Fellow in the Max Planck Institute for Solid State Research, Stuttgart, Germany, where he was involved in exciton radiative decay in l...Show More
D. S. Citrin (M’93–SM’03) received the B.A. degree from Williams College, Williamstown, MA, USA, in 1985, and the M.S. and Ph.D. degrees from the University of Illinois Champaign, IL, USA, in 1987 and 1991, respectively, all in physics. From 1992 to 1993, he was a Postdoctoral Research Fellow in the Max Planck Institute for Solid State Research, Stuttgart, Germany, where he was involved in exciton radiative decay in l...View more

I. Introduction

Nondestructive evaluation (NDE) techniques for monitoring and characterizing coatings on metals are essential to verify protection of the metal substrate from corrosion during service. Coating failure can have many causes and manifestations. Especially, when a region of a coating system becomes detached from its substrate, the term “adhesion failure” is commonly used. Delamination and blistering are two important types of coating failure in which compromised adhesion is strongly implicated [1]. Since the exact cause and nature of coating failure is still in dispute [2], various NDE techniques have been explored to study damage mechanisms in coatings, such as electrochemical impedance spectroscopy (EIS) [3], scanning electrochemical microscopy [4], acoustic emission [5], and thermography [6], [7], to name a few. However, not all of the NDE techniques mentioned above can provide quantitative information in depth, nor may they all be capable of monitoring the condition of adhesion. Scanning acoustic microscopy (SAM) [2], [8], [9] and laser-ultrasonics [10] can provide depth-specific information with enough resolution for characterizing coating systems; however, high attenuation in polymer materials limits the penetration depth of the ultrasonic waves [8]. Therefore, alternative NDE techniques with relatively high resolution are still sought for quantitative evaluation of polymer coatings.

Author image of Junliang Dong
School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA
UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, Metz, France
Junliang Dong (S’16) received the M.S. degree in control science and engineering from Tsinghua University, Beijing, China, in 2011. He is currently working toward the Ph.D. degree at Georgia Institute of Technology, Atlanta, GA, USA. His research interests include terahertz imaging and spectroscopy, terahertz optics, and nondestructive testing.
Junliang Dong (S’16) received the M.S. degree in control science and engineering from Tsinghua University, Beijing, China, in 2011. He is currently working toward the Ph.D. degree at Georgia Institute of Technology, Atlanta, GA, USA. His research interests include terahertz imaging and spectroscopy, terahertz optics, and nondestructive testing.View more
Author image of Alexandre Locquet
School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA
UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, Metz, France
Alexandre Locquet received the M.S. degree in electrical engineering from the Faculté Polytechnique de Mons, Mons, Belgium, the Ph.D. degree (doctorat) in engineering science, and electrical and computer engineering from the Université de Franche-Comté, Besançon, France, and the Ph.D. degree in electrical and computer engineering from the Georgia Institute of Technology (Georgia Tech), Atlanta, GA, USA. He is currently a Researcher at the Unité Mixte Internationale, Georgia Tech-CNRS Laboratory, Georgia Tech Lorraine, Metz, France, and an adjunct Professor in the School of Electrical and Computer Engineering, Georgia Tech. He has authored or coauthored more than 40 journal publications and conference presentations, and 1 book chapter. His research interests include semiconductor laser dynamics and chaos, nonlinear time series analysis, physical-layer security, and terahertz imaging. He is a Member of Eta Kappa Nu, the Optical Society of America, and the IEEE Photonics Society.
Alexandre Locquet received the M.S. degree in electrical engineering from the Faculté Polytechnique de Mons, Mons, Belgium, the Ph.D. degree (doctorat) in engineering science, and electrical and computer engineering from the Université de Franche-Comté, Besançon, France, and the Ph.D. degree in electrical and computer engineering from the Georgia Institute of Technology (Georgia Tech), Atlanta, GA, USA. He is currently a Researcher at the Unité Mixte Internationale, Georgia Tech-CNRS Laboratory, Georgia Tech Lorraine, Metz, France, and an adjunct Professor in the School of Electrical and Computer Engineering, Georgia Tech. He has authored or coauthored more than 40 journal publications and conference presentations, and 1 book chapter. His research interests include semiconductor laser dynamics and chaos, nonlinear time series analysis, physical-layer security, and terahertz imaging. He is a Member of Eta Kappa Nu, the Optical Society of America, and the IEEE Photonics Society.View more
Author image of D. S. Citrin
School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA
UMI 2958 Georgia Tech-CNRS, Georgia Tech Lorraine, Metz, France
D. S. Citrin (M’93–SM’03) received the B.A. degree from Williams College, Williamstown, MA, USA, in 1985, and the M.S. and Ph.D. degrees from the University of Illinois Champaign, IL, USA, in 1987 and 1991, respectively, all in physics. From 1992 to 1993, he was a Postdoctoral Research Fellow in the Max Planck Institute for Solid State Research, Stuttgart, Germany, where he was involved in exciton radiative decay in low-dimensional semiconductor structures. Subsequently, from 1993 to 1995, he was a Center Fellow in the Center for Ultrafast Optical Science, University of Michigan, Ann Arbor, MI, USA, where he studied ultrafast phenomena in quantum wells. He was then an Assistant Professor of physics with Washington State University, Pullman, WA, USA from 1995 to 2001. In 2001, he joined the faculty of the Georgia Institute of Technology, where he is currently a Professor of electrical and computer engineering. In addition, he coordinates the research effort on nonlinear optics and dynamics with the Unité Mixte Internationale, Georgia Tech-CNRS UMI 2958, Georgia Tech Lorraine, Metz, France. His research interests include terahertz science and technology, nonlinear dynamics in external-cavity semiconductor lasers, and nanophotonics. He has served as an Associate Editor of the IEEE Journal of Quantum Electronics. He received the Presidential Early Career Award for Scientists and Engineers and the Friedrich Bessel Prize from the Alexandre von Humboldt Stiftung.
D. S. Citrin (M’93–SM’03) received the B.A. degree from Williams College, Williamstown, MA, USA, in 1985, and the M.S. and Ph.D. degrees from the University of Illinois Champaign, IL, USA, in 1987 and 1991, respectively, all in physics. From 1992 to 1993, he was a Postdoctoral Research Fellow in the Max Planck Institute for Solid State Research, Stuttgart, Germany, where he was involved in exciton radiative decay in low-dimensional semiconductor structures. Subsequently, from 1993 to 1995, he was a Center Fellow in the Center for Ultrafast Optical Science, University of Michigan, Ann Arbor, MI, USA, where he studied ultrafast phenomena in quantum wells. He was then an Assistant Professor of physics with Washington State University, Pullman, WA, USA from 1995 to 2001. In 2001, he joined the faculty of the Georgia Institute of Technology, where he is currently a Professor of electrical and computer engineering. In addition, he coordinates the research effort on nonlinear optics and dynamics with the Unité Mixte Internationale, Georgia Tech-CNRS UMI 2958, Georgia Tech Lorraine, Metz, France. His research interests include terahertz science and technology, nonlinear dynamics in external-cavity semiconductor lasers, and nanophotonics. He has served as an Associate Editor of the IEEE Journal of Quantum Electronics. He received the Presidential Early Career Award for Scientists and Engineers and the Friedrich Bessel Prize from the Alexandre von Humboldt Stiftung.View more

Contact IEEE to Subscribe

References

References is not available for this document.