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Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets | IEEE Conference Publication | IEEE Xplore

Testing Parametric and Catastrophic Faults in Mixed-Signal Integrated Circuits Using Wavelets


Abstract:

In this paper a test method for testing both parametric and catastrophic faults in analog and mixed signal Integrated Circuits (ICs) is presented. It is based on the wave...Show More

Abstract:

In this paper a test method for testing both parametric and catastrophic faults in analog and mixed signal Integrated Circuits (ICs) is presented. It is based on the wavelet transformation of the measured signal, be it supply current (IPS) or output voltage (VOUT) waveform. The tolerance limit for the good or reference IC is set by statistical processing data obtained from a set of fault-free ICs. In the wavelet analysis, two test metrics one named discrimination factor and one utilizing Mahalanobis distances are introduced. Both metrics rely on wavelet energy computation. Results from the application of the proposed method in testing known analog and mixed signal IC benchmarks are presented showing the effectiveness of the proposed testing scheme.
Date of Conference: 05-07 July 2010
Date Added to IEEE Xplore: 16 September 2010
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ISSN Information:

Conference Location: Lixouri, Greece

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