Abstract:
In this paper the approach to automatic exam sheets evaluation is presented. In our task the exam is written on paper forms and scanned. The bitmaps are processed to extr...Show MoreMetadata
Abstract:
In this paper the approach to automatic exam sheets evaluation is presented. In our task the exam is written on paper forms and scanned. The bitmaps are processed to extract the specific task area and then the task is evaluated with aid of image processing and analysis. In this work we present the algorithm for automatic evaluation of function plot. The algorithm has been verified against the set of 47 sheets. Simultaneously the works have been graded be a qualified teacher.
Published in: 2010 Proceedings of VIth International Conference on Perspective Technologies and Methods in MEMS Design
Date of Conference: 20-23 April 2010
Date Added to IEEE Xplore: 01 July 2010
ISBN Information:
Conference Location: Lviv, Ukraine
Contents 