Abstract:
An automated manipulation procedure for spherical nanoparticles with an atomic force microscope (AFM) in 2-D is demonstrated. Robust particle-center and contact-loss dete...Show MoreMetadata
Abstract:
An automated manipulation procedure for spherical nanoparticles with an atomic force microscope (AFM) in 2-D is demonstrated. Robust particle-center and contact-loss detection algorithms are developed using force feedback to improve speed and reliability issues of AFM-based nanomanipulation. Unlike blind manipulation techniques, contact-loss detection enables better control over the success of manipulation. For pattern formation and assembly operations, a fully automated multiple-particle-manipulation method is developed, based on a commanding task planner. The task planner minimizes the obstacles to manipulation trajectories for better efficiency. Forces during AFM tip-particle-substrate contact are analyzed theoretically to determine the mode of manipulation as well as the effect of cantilever normal stiffness. The developed system is used to form patterns and assemblies of 100-nm-diameter gold nanoparticles on a flat substrate.
Published in: IEEE Transactions on Nanotechnology ( Volume: 10, Issue: 3, May 2011)
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- IEEE Keywords
- Index Terms
- Atomic Force Microscopy ,
- Use Of Nanoparticles ,
- Gold Nanoparticles ,
- Force Feedback ,
- Atomic Force Microscopy Tip ,
- Task Planning ,
- Normal Stiffness ,
- Contact Angle ,
- Target Location ,
- Successful Use ,
- Atomic Force Microscopy Images ,
- Interaction Forces ,
- Friction Force ,
- Particle Position ,
- Normal Component ,
- Normal Force ,
- Stiffness Values ,
- Loss Of Contact ,
- Force Model ,
- Use Of Particles ,
- Atomic Force Microscopy System ,
- Mica Surface ,
- Particle Center ,
- Nanoelectromechanical Systems ,
- Contact Radius ,
- Scanning Probe Microscopy ,
- Watershed Segmentation ,
- Geometric Relationship ,
- Line Scan ,
- Rolling
- Author Keywords
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Atomic Force Microscopy ,
- Use Of Nanoparticles ,
- Gold Nanoparticles ,
- Force Feedback ,
- Atomic Force Microscopy Tip ,
- Task Planning ,
- Normal Stiffness ,
- Contact Angle ,
- Target Location ,
- Successful Use ,
- Atomic Force Microscopy Images ,
- Interaction Forces ,
- Friction Force ,
- Particle Position ,
- Normal Component ,
- Normal Force ,
- Stiffness Values ,
- Loss Of Contact ,
- Force Model ,
- Use Of Particles ,
- Atomic Force Microscopy System ,
- Mica Surface ,
- Particle Center ,
- Nanoelectromechanical Systems ,
- Contact Radius ,
- Scanning Probe Microscopy ,
- Watershed Segmentation ,
- Geometric Relationship ,
- Line Scan ,
- Rolling
- Author Keywords