Abstract:
A new extraction method of series resistance based on the radio frequency S-parameter measurement for sub -0.1 mum metal oxide semiconductor field-effect transistor is pr...Show MoreMetadata
Abstract:
A new extraction method of series resistance based on the radio frequency S-parameter measurement for sub -0.1 mum metal oxide semiconductor field-effect transistor is presented. The practical limit of conventional methods is analyzed from measurement and simulation. From this analysis, analytical expressions are derived, and linear regression techniques are used to extract the series resistances. The proposed method improves the accuracy and reduces the measurement frequency.
Published in: IEEE Microwave and Wireless Components Letters ( Volume: 18, Issue: 10, October 2008)
Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Radiofrequency ,
- Series Resistance ,
- Linear Regression ,
- Measurement Frequency ,
- Resistance Method ,
- Linear Regression Techniques ,
- Analysis Of Parameters ,
- Line Plots ,
- Very High Frequency ,
- High Frequency Range ,
- High-frequency Data ,
- Conventional Extraction Methods ,
- Corner Frequency ,
- Intercept Point ,
- Small Circuit ,
- Final Calibration
- Author Keywords
Contents Keywords assist with retrieval of results and provide a means to discovering other relevant content. Learn more.
- IEEE Keywords
- Index Terms
- Radiofrequency ,
- Series Resistance ,
- Linear Regression ,
- Measurement Frequency ,
- Resistance Method ,
- Linear Regression Techniques ,
- Analysis Of Parameters ,
- Line Plots ,
- Very High Frequency ,
- High Frequency Range ,
- High-frequency Data ,
- Conventional Extraction Methods ,
- Corner Frequency ,
- Intercept Point ,
- Small Circuit ,
- Final Calibration
- Author Keywords
