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Static Upset Characteristics of the 90nm Virtex-4QV FPGAs | IEEE Conference Publication | IEEE Xplore

Static Upset Characteristics of the 90nm Virtex-4QV FPGAs


Abstract:

Radiation Test Consortium (XRTC) single-event measurements for three of the latest generation of radiation-tolerant reconfigurable FPGAs from Xilinx (90 nm, copper- inter...Show More

Abstract:

Radiation Test Consortium (XRTC) single-event measurements for three of the latest generation of radiation-tolerant reconfigurable FPGAs from Xilinx (90 nm, copper- interconnected, thin-epitaxial CMOS) are presented. Results include proton and heavy-ion upset susceptibilities for unclocked memory elements, high-temperature latchup immunity and a low SEFI rate (e.g., ~one/device-century in geosynchronous orbit).
Date of Conference: 14-18 July 2008
Date Added to IEEE Xplore: 03 October 2008
Print ISBN:978-1-4244-2545-7

ISSN Information:

Conference Location: Tucson, AZ, USA

References

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