Abstract:
A dynamic characterization of analog-digital converter integral nonlinearity (INL) is considered. When using a plurality of test frequencies in the measurement set-up, th...Show MoreMetadata
Abstract:
A dynamic characterization of analog-digital converter integral nonlinearity (INL) is considered. When using a plurality of test frequencies in the measurement set-up, the dynamic errors of the converter are characterized. The INL is modeled by low and high code components - LCF and HCF, respectively. The LCF and HCF are parameterized and a least squares method is derived for the estimation of the parameter values from obtained measurements. A closed form solution to the estimation problem is derived and its performance is illustrated by a numerical example. The proposed method is believed to be fruitful in wide-band characterization of analog-digital converters at radio frequency, and thus of importance for the evaluation of modern and future wireless communication systems.
Date of Conference: 12-15 February 2007
Date Added to IEEE Xplore: 27 June 2008
Print ISBN:978-1-4244-0778-1