A four-valued logic and switch-level differences | IEEE Conference Publication | IEEE Xplore

A four-valued logic and switch-level differences


Abstract:

In this paper, the application of a four-valued logic to the switch-level test generation is studied. A switch-level operator fault model is proposed. Switch-level U diff...Show More

Abstract:

In this paper, the application of a four-valued logic to the switch-level test generation is studied. A switch-level operator fault model is proposed. Switch-level U difference and Z difference of a function to a fault are defined. A method to derive switch-level differences is given. Finally, a new switch-level test generation algorithm for CMOS circuits is presented.<>
Date of Conference: 25-27 May 1994
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-8186-5650-6
Conference Location: Boston, MA, USA

References

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