Abstract:
The analysis of probe operational parameters such as configuration of the probe, including triggering (measuring) force, stiffness, and length of the stylus, has been per...Show MoreMetadata
Abstract:
The analysis of probe operational parameters such as configuration of the probe, including triggering (measuring) force, stiffness, and length of the stylus, has been performed. A new method allowing three-dimensional (3-D) probe error characteristics with several times more accuracy than the procedure used on a coordinate measuring machine (CMM) has been applied. The analyses have been performed for devices of two types: a single-stage and a two-stage switching probe. The influence of the above-mentioned parameters has been analyzed theoretically and verified experimentally in two planes: perpendicular and parallel to the probe axis. Good agreement between the proposed theoretical model and experimental data has been obtained.
Published in: IEEE Transactions on Instrumentation and Measurement ( Volume: 54, Issue: 6, December 2005)