Test set embedding for deterministic BIST using a reconfigurable interconnection network | IEEE Journals & Magazine | IEEE Xplore

Test set embedding for deterministic BIST using a reconfigurable interconnection network


Abstract:

We present a new approach for deterministic built-in self-test (BIST) in which a reconfigurable interconnection network (RIN) is placed between the outputs of a pseudoran...Show More

Abstract:

We present a new approach for deterministic built-in self-test (BIST) in which a reconfigurable interconnection network (RIN) is placed between the outputs of a pseudorandom pattern generator and the scan inputs of the circuit under test (CUT). The RIN, which consists only of multiplexer switches, replaces the phase shifter that is typically used in pseudorandom BIST to reduce correlation between the test data bits that are fed into the scan chains. The connections between the linear-feedback shift-register (LFSR) and the scan chains can be dynamically changed (reconfigured) during a test session. In this way, the RIN is used to match the LFSR outputs to the test cubes in a deterministic test set. The control data bits used for reconfiguration ensure that all the deterministic test cubes are embedded in the test patterns applied to the CUT. The proposed approach requires very little hardware overhead, only a modest amount of CPU time, and fewer control bits compared to the storage required for reseeding techniques or for hybrid BIST. Moreover, as a nonintrusive BIST solution, it does not require any circuit redesign and has minimal impact on circuit performance.
Page(s): 1289 - 1305
Date of Publication: 30 August 2004

ISSN Information:

Author image of Lei Li
Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA
Lei Li received the B.S. and M.S. degrees in electrical engineering from Peking University, Beijing, China, in 1996 and 1999, respectively, and the M.S. degree in electrical and computer engineering in 2002 from Duke University, Durham, NC, where he is currently pursuing the Ph.D. degree in electrical and computer engineering.
He is a currently a Research Assistant at Duke University. His research interests are in the fiel...Show More
Lei Li received the B.S. and M.S. degrees in electrical engineering from Peking University, Beijing, China, in 1996 and 1999, respectively, and the M.S. degree in electrical and computer engineering in 2002 from Duke University, Durham, NC, where he is currently pursuing the Ph.D. degree in electrical and computer engineering.
He is a currently a Research Assistant at Duke University. His research interests are in the fiel...View more
Author image of K. Chakrabarty
Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA
Krishnendu Chakrabarty (S'92–M'96–SM'00) received the B.Tech. degree from the Indian Institute of Technology, Kharagpur, India, in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, in 1992 and 1995, respectively, all in computer science and engineering.
He is currently an Associate Professor of Electrical and Computer Engineering at Duke University, Durham, NC. From 2000 to 2002, he was als...Show More
Krishnendu Chakrabarty (S'92–M'96–SM'00) received the B.Tech. degree from the Indian Institute of Technology, Kharagpur, India, in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, in 1992 and 1995, respectively, all in computer science and engineering.
He is currently an Associate Professor of Electrical and Computer Engineering at Duke University, Durham, NC. From 2000 to 2002, he was als...View more

Author image of Lei Li
Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA
Lei Li received the B.S. and M.S. degrees in electrical engineering from Peking University, Beijing, China, in 1996 and 1999, respectively, and the M.S. degree in electrical and computer engineering in 2002 from Duke University, Durham, NC, where he is currently pursuing the Ph.D. degree in electrical and computer engineering.
He is a currently a Research Assistant at Duke University. His research interests are in the field of VLSI testing, with an emphasis on the techniques reducing test data volume and test application time.
Lei Li received the B.S. and M.S. degrees in electrical engineering from Peking University, Beijing, China, in 1996 and 1999, respectively, and the M.S. degree in electrical and computer engineering in 2002 from Duke University, Durham, NC, where he is currently pursuing the Ph.D. degree in electrical and computer engineering.
He is a currently a Research Assistant at Duke University. His research interests are in the field of VLSI testing, with an emphasis on the techniques reducing test data volume and test application time.View more
Author image of K. Chakrabarty
Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA
Krishnendu Chakrabarty (S'92–M'96–SM'00) received the B.Tech. degree from the Indian Institute of Technology, Kharagpur, India, in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, in 1992 and 1995, respectively, all in computer science and engineering.
He is currently an Associate Professor of Electrical and Computer Engineering at Duke University, Durham, NC. From 2000 to 2002, he was also a Mercator Visiting Professor at the University of Potsdam, Potsdam, Germany. His current research projects include: design and testing of system-on-a-chip integrated circuits; embedded real-time systems; distributed sensor networks; modeling, simulation, and optimization of microelectrofluidic systems; microfluidics-based chip cooling. He is a coauthor of two books: Microelectrofluidic Systems: Modeling and Simulation (Boca Raton, FL: CRC Press, 2002) and Test Resource Partitioning for System-on-a-Chip (Norwell, MA: Kluwer, 2002), and an editor of SOC (System-on-a-Chip) Testing for Plug and Play Test Automation (Norwell, MA: Kluwer, 2002). He has published over 160 papers in journals and refereed conference proceedings, and holds a US patent in BIST.
Dr. Chakrabarty is a Member of ACM, ACM SIGDA, and Sigma Xi. He is a recipient of the National Science Foundation Early Faculty (CAREER) Award and the Office of Naval Research Young Investigator Award. He received a best paper award at the 2001 Design, Automation, and Test in Europe (DATE) Conference. He is also the recipient of the Humboldt Research Fellowship, awarded by the Alexander von Humboldt Foundation, Germany. He is an Associate Editor of IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, an Editor of the Journal of Electronic Testing: Theory and Applications (JETTA), and a member of the editorial board for Sensor Letters and the Journal of Embedded Computing. He has also served as an Associate Editor of the IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—PART II: ANALOG AND DIGITAL SIGNAL PROCESSING. He serves as Vice Chair of Technical Activities of the IEEE's Test Technology Technical Council and is a Member of the program committees of several IEEE/ACM conferences and workshops.
Krishnendu Chakrabarty (S'92–M'96–SM'00) received the B.Tech. degree from the Indian Institute of Technology, Kharagpur, India, in 1990, and the M.S.E. and Ph.D. degrees from the University of Michigan, Ann Arbor, in 1992 and 1995, respectively, all in computer science and engineering.
He is currently an Associate Professor of Electrical and Computer Engineering at Duke University, Durham, NC. From 2000 to 2002, he was also a Mercator Visiting Professor at the University of Potsdam, Potsdam, Germany. His current research projects include: design and testing of system-on-a-chip integrated circuits; embedded real-time systems; distributed sensor networks; modeling, simulation, and optimization of microelectrofluidic systems; microfluidics-based chip cooling. He is a coauthor of two books: Microelectrofluidic Systems: Modeling and Simulation (Boca Raton, FL: CRC Press, 2002) and Test Resource Partitioning for System-on-a-Chip (Norwell, MA: Kluwer, 2002), and an editor of SOC (System-on-a-Chip) Testing for Plug and Play Test Automation (Norwell, MA: Kluwer, 2002). He has published over 160 papers in journals and refereed conference proceedings, and holds a US patent in BIST.
Dr. Chakrabarty is a Member of ACM, ACM SIGDA, and Sigma Xi. He is a recipient of the National Science Foundation Early Faculty (CAREER) Award and the Office of Naval Research Young Investigator Award. He received a best paper award at the 2001 Design, Automation, and Test in Europe (DATE) Conference. He is also the recipient of the Humboldt Research Fellowship, awarded by the Alexander von Humboldt Foundation, Germany. He is an Associate Editor of IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, an Editor of the Journal of Electronic Testing: Theory and Applications (JETTA), and a member of the editorial board for Sensor Letters and the Journal of Embedded Computing. He has also served as an Associate Editor of the IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—PART II: ANALOG AND DIGITAL SIGNAL PROCESSING. He serves as Vice Chair of Technical Activities of the IEEE's Test Technology Technical Council and is a Member of the program committees of several IEEE/ACM conferences and workshops.View more

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