Loading [a11y]/accessibility-menu.js
Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection | IEEE Conference Publication | IEEE Xplore

Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection


Abstract:

This paper evaluates radiation-induced software failure detection in embedded processors from the Cortex-M family. Our proposed methodology performs heavy ion irradiation...Show More

Abstract:

This paper evaluates radiation-induced software failure detection in embedded processors from the Cortex-M family. Our proposed methodology performs heavy ion irradiation experiments and establishes a connection with emulated fault injection for a benchmark of applications. We experimented on a set of case-studies in bare-metal and with the FreeRTOS operating system with different configurations, tailoring our approach for deployment in small satellite missions. Additionally, we tested a fault tolerance technique for fault detection. Results show coherence between irradiation and fault injection and can help designers build better fault tolerance mechanisms.
Date of Conference: 09-12 April 2024
Date Added to IEEE Xplore: 28 May 2024
ISBN Information:
Print on Demand(PoD) ISSN: 2373-0862
Conference Location: Maceio, Brazil

Contact IEEE to Subscribe

References

References is not available for this document.