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Characterization of Yield Spatial Variability of European Hazelnut (Corylus Avellana L), Using Auxiliary Variables of High Spatial Resolution | IEEE Conference Publication | IEEE Xplore

Characterization of Yield Spatial Variability of European Hazelnut (Corylus Avellana L), Using Auxiliary Variables of High Spatial Resolution


Abstract:

European hazelnut is one of the most important nut fruit trees worldwide. However, there is few information on the interaction between different productive variables that...Show More

Abstract:

European hazelnut is one of the most important nut fruit trees worldwide. However, there is few information on the interaction between different productive variables that influence fruit yield per unit area in different regions of the world. In this regard, the present research aims to identify the most important auxiliary variables of high spatial resolution that allow describing the yield of the European hazelnut. The proposed methodology allowed the identification of seven productive management variables, which would be closely related to the yield of this crop. These variables would be the multispectral indices calculated using satellite images Sentinel2; Advanced Vegetation Indices (AVI), Enhanced Vegetation Indices (EVI) and Soil Adjusted Vegetation Indices (SAVI), together with two-dimensional and three-dimensional leaf area, xylem water potential and diameter and total number of axles per plant. The selected variables showed a high spatial dependence in the experimental semivariogram with values > 0.8. Additionally, a high correlation with yield was identified (R > 0.6). These variables allow us to understand that the yield achieved by the European hazelnut tree depends on the vegetative expression of the plant reached within the season. On the other hand, these variables allow us to characterize the spatial variability of the European hazelnut and understand the high spatial dependence that exists between the different sampling sites at the intra-farm scale of the orchard.
Date of Conference: 05-07 December 2023
Date Added to IEEE Xplore: 15 February 2024
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Conference Location: Valdivia, Chile

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