Design and Testing of a Hard-Fault Protection Circuit for a 1 kV SiC MOSFET Inverter | IEEE Conference Publication | IEEE Xplore

Design and Testing of a Hard-Fault Protection Circuit for a 1 kV SiC MOSFET Inverter


Abstract:

Due to increasingly high DC link voltages and further advancements in the current density of silicon carbide (SiC) MOSFETs, it has become evident that conventional IGBT p...Show More

Abstract:

Due to increasingly high DC link voltages and further advancements in the current density of silicon carbide (SiC) MOSFETs, it has become evident that conventional IGBT protection methods are not sufficient to prevent exceeding the current rating of these devices during low-inductance fault events. This paper explores the use of an air core Rogowski coil topology to mitigate these hard fault events. The design of this circuit resulted in safe shutdown of a low impedance phase-to-phase fault in under one microsecond, tested up to DC link voltages of 1kV. This paper details the theory, design, simulation, and successful test results of this method.
Date of Conference: 29 October 2023 - 02 November 2023
Date Added to IEEE Xplore: 29 December 2023
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Conference Location: Nashville, TN, USA

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