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Inspection challenges of leadless packages | IEEE Conference Publication | IEEE Xplore

Inspection challenges of leadless packages


Abstract:

The advantages of leadless devices are many, but along with the new technology come new inspection challenges. This paper explores the post-singulation inspection challen...Show More

Abstract:

The advantages of leadless devices are many, but along with the new technology come new inspection challenges. This paper explores the post-singulation inspection challenges related to the implementation of leadless packages from the perspective of a user implementing a new packaging technology, as well as that of a supplier of inspection tools working to address unique challenges inherent in the package design. Inspection challenges to be reviewed include coplanarity, pad integrity, board quality, package sides and mark inspection.
Date of Conference: 17-18 July 2002
Date Added to IEEE Xplore: 07 November 2002
Print ISBN:0-7803-7301-4
Conference Location: San Jose, CA, USA

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