A Survey- Wheat Plant Diseases Recognition System using Deep Learning Techniques | IEEE Conference Publication | IEEE Xplore

A Survey- Wheat Plant Diseases Recognition System using Deep Learning Techniques


Abstract:

Even in cases of high population growth, agriculture nevertheless provides food for all people. To ensure the supply of food for the entire population, it is advised to a...Show More

Abstract:

Even in cases of high population growth, agriculture nevertheless provides food for all people. To ensure the supply of food for the entire population, it is advised to anticipate Wheat illnesses at an early stage. However, it is unfortunate that illnesses can be predicted so early in the crop-cycle. The purpose of the publication is to raise farmers' understanding of the most recent techniques for minimising infections in wheat plant leaves. With the use of appropriate pesticides and prompt treatment, wheat will be grown in bigger quantities. Due to the ability to determine whether to continue growing the crop thanks to early diagnosis of wheat diseases, the farmer will have less work to undertake.
Date of Conference: 14-16 March 2023
Date Added to IEEE Xplore: 20 April 2023
ISBN Information:
Conference Location: Uttarakhand, India

References

References is not available for this document.