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The road to better reliability and yield embedded DfM tools | IEEE Conference Publication | IEEE Xplore

The road to better reliability and yield embedded DfM tools


Abstract:

This paper gives an overview of the different tools, needed for accomplishing optimal IC manufacturability and rapid technology learning during the successive phases of p...Show More

Abstract:

This paper gives an overview of the different tools, needed for accomplishing optimal IC manufacturability and rapid technology learning during the successive phases of process maturity. The paper then describes two specific DfM tools that are in use within Philips Semiconductors.
Date of Conference: 27-30 March 2000
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7695-0537-6
Conference Location: Paris, France

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