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Reliability and Failure Analysis of UHF RFID Passive Tags Under Thermal Storage | IEEE Journals & Magazine | IEEE Xplore

Reliability and Failure Analysis of UHF RFID Passive Tags Under Thermal Storage


Abstract:

This paper proposes studying the effects of thermal storage on the reliability of passive ultra-high frequency radio-frequency identification tags. Two types of tags M1 a...Show More

Abstract:

This paper proposes studying the effects of thermal storage on the reliability of passive ultra-high frequency radio-frequency identification tags. Two types of tags M1 and M2 from two different manufacturers are aged under two high temperatures equal to 408 K and 433 K. Tested tags are put into thermal storage oven hang fixed terms. The performances of these tags are measured after each aging phase to determine the power loss caused by high-temperature storage. Then, a mathematical approach is used to estimate for both tags from the two manufacturers the law of reliability under nominal conditions. Statistical and physical analyses of the results allow us to study and analyze the mechanisms of aging. It is observed that the failure mechanisms depend on the type of passive tags and the values of selected storage temperatures for the tests. The scale parameters of M1 tags aged at 408 K are around 280 h, whereas the scale parameters of the M2 tags aged at the same temperature are around 360 h. Cracks on the antenna are observed with the higher temperature equal to 433 K for M1 tags. However, the changes of the performance of others tags are probably caused by changes in the matching of the impedance between the antenna and the radio-frequency integrated circuit. From this study, various failure mechanisms demonstrate the necessity of determining the type of passive tags and the used temperature.
Published in: IEEE Transactions on Device and Materials Reliability ( Volume: 17, Issue: 3, September 2017)
Page(s): 531 - 538
Date of Publication: 31 July 2017

ISSN Information:

Author image of Sanae Taoufik
Laboratory of Information Technology and Communication, National School of Applied Sciences of Tangier, Abdelmalek Essaâdi University, Tétouan, Morocco
Groupe de Physique des Matériaux, INSA Rouen, CNRS, Normandie Université, UNIROUEN, Saint Étienne du Rouvray, France
Sanae Taoufik received the engineering degree in electronics and telecommunications from Mohammed VI International Academy of Civil Aviation, Casablanca, Morocco, in 2012. She is currently pursuing the Ph.D. degree with the Abdelmalek Essaâdi University, National School of Applied Sciences of Tangier, Morocco, and the GPM Laboratory, University of Rouen, Rouen, France. Her thesis research concerns the study of the reliabi...Show More
Sanae Taoufik received the engineering degree in electronics and telecommunications from Mohammed VI International Academy of Civil Aviation, Casablanca, Morocco, in 2012. She is currently pursuing the Ph.D. degree with the Abdelmalek Essaâdi University, National School of Applied Sciences of Tangier, Morocco, and the GPM Laboratory, University of Rouen, Rouen, France. Her thesis research concerns the study of the reliabi...View more
Author image of Pascal Dherbécourt
Groupe de Physique des Matériaux, INSA Rouen, CNRS, Normandie Université, UNIROUEN, Saint Étienne du Rouvray, France
Pascal Dherbécourt received the Diploma degree and the Ph.D. degree in physics of electronics of telecommunication in 2002. From 1999 to 2008, he researched in the field of optical-fibers telecommunications. In 2008, he joined the GPM Laboratory, University of Rouen, and became a Co-Founder and a member of Erdefi Team (research team in reliability and failure analysis of electronic components). His main research interests...Show More
Pascal Dherbécourt received the Diploma degree and the Ph.D. degree in physics of electronics of telecommunication in 2002. From 1999 to 2008, he researched in the field of optical-fibers telecommunications. In 2008, he joined the GPM Laboratory, University of Rouen, and became a Co-Founder and a member of Erdefi Team (research team in reliability and failure analysis of electronic components). His main research interests...View more
Author image of Ahmed El Oualkadi
Laboratory of Information Technology and Communication, National School of Applied Sciences of Tangier, Abdelmalek Essaâdi University, Tétouan, Morocco
Ahmed El Oualkadi (M’02) received the Ph.D. degree in electronics from the University of Poitiers, France, in 2004. From 2000 to 2003, he was a Research Assistant with the Laboratoire d’Automatique et d’Informatique Industrielle, Ecole Supérieure d’Ingénieurs de Poitiers, Electronics & Electrostatics Research Unit, University of Poitiers. In 2004, he was an Assistant Professor with the University Institute of Technology, ...Show More
Ahmed El Oualkadi (M’02) received the Ph.D. degree in electronics from the University of Poitiers, France, in 2004. From 2000 to 2003, he was a Research Assistant with the Laboratoire d’Automatique et d’Informatique Industrielle, Ecole Supérieure d’Ingénieurs de Poitiers, Electronics & Electrostatics Research Unit, University of Poitiers. In 2004, he was an Assistant Professor with the University Institute of Technology, ...View more
Author image of Farid Temcamani
ENSEA National School of Electronics and Its Applications, Quartz Laboratory, Cergy Pontoise, France
Farid Temcamani (M’04) received the Ph.D. degree in electronics. He joined the Institut d’Electronique, de Microélectronique et de Nanotechnologie of Lille, Lille, France, in 1985. He worked in the Active Devices Group. His thesis research concerned multiple channel HEMTs for microwave power amplification. In 1991, he joined the ECIME Laboratory, Engineering College, Ecole Nationale Supérieur de l’Electronique et de ses A...Show More
Farid Temcamani (M’04) received the Ph.D. degree in electronics. He joined the Institut d’Electronique, de Microélectronique et de Nanotechnologie of Lille, Lille, France, in 1985. He worked in the Active Devices Group. His thesis research concerned multiple channel HEMTs for microwave power amplification. In 1991, he joined the ECIME Laboratory, Engineering College, Ecole Nationale Supérieur de l’Electronique et de ses A...View more

I. Introduction

Radio-frequency identification (RFID) is the most important and famous non-contact systems [1]. It is based on data exchange between a transmitter and receiver by the way of electromagnetic signals. RFID technology is used in diverse domains for various applications, because of its flexibility and ability to track and identify persons and objects. RFID is used in healthcare in sensor nets to detect the environment [2], [3], it also used in logistics and security, which it is important to track and identify products aiming to guarantee quality and security during manufacture, distribution and shipment [3].

Author image of Sanae Taoufik
Laboratory of Information Technology and Communication, National School of Applied Sciences of Tangier, Abdelmalek Essaâdi University, Tétouan, Morocco
Groupe de Physique des Matériaux, INSA Rouen, CNRS, Normandie Université, UNIROUEN, Saint Étienne du Rouvray, France
Sanae Taoufik received the engineering degree in electronics and telecommunications from Mohammed VI International Academy of Civil Aviation, Casablanca, Morocco, in 2012. She is currently pursuing the Ph.D. degree with the Abdelmalek Essaâdi University, National School of Applied Sciences of Tangier, Morocco, and the GPM Laboratory, University of Rouen, Rouen, France. Her thesis research concerns the study of the reliability of the RFID systems under severe environmental conditions.
Sanae Taoufik received the engineering degree in electronics and telecommunications from Mohammed VI International Academy of Civil Aviation, Casablanca, Morocco, in 2012. She is currently pursuing the Ph.D. degree with the Abdelmalek Essaâdi University, National School of Applied Sciences of Tangier, Morocco, and the GPM Laboratory, University of Rouen, Rouen, France. Her thesis research concerns the study of the reliability of the RFID systems under severe environmental conditions.View more
Author image of Pascal Dherbécourt
Groupe de Physique des Matériaux, INSA Rouen, CNRS, Normandie Université, UNIROUEN, Saint Étienne du Rouvray, France
Pascal Dherbécourt received the Diploma degree and the Ph.D. degree in physics of electronics of telecommunication in 2002. From 1999 to 2008, he researched in the field of optical-fibers telecommunications. In 2008, he joined the GPM Laboratory, University of Rouen, and became a Co-Founder and a member of Erdefi Team (research team in reliability and failure analysis of electronic components). His main research interests are now reliability and failure analysis of high-power microwave transistors for telecommunication and RADAR applications and switching power components. He is engaged in several national and international research projects. He participates in numerous research projects in collaboration with major companies. He has authored and co-authored over 60 articles in international journals and congresses. He found a bachelor program in electronics in 2005 with the University of Rouen, where he also develops training programs for aeronautics and space business.
Pascal Dherbécourt received the Diploma degree and the Ph.D. degree in physics of electronics of telecommunication in 2002. From 1999 to 2008, he researched in the field of optical-fibers telecommunications. In 2008, he joined the GPM Laboratory, University of Rouen, and became a Co-Founder and a member of Erdefi Team (research team in reliability and failure analysis of electronic components). His main research interests are now reliability and failure analysis of high-power microwave transistors for telecommunication and RADAR applications and switching power components. He is engaged in several national and international research projects. He participates in numerous research projects in collaboration with major companies. He has authored and co-authored over 60 articles in international journals and congresses. He found a bachelor program in electronics in 2005 with the University of Rouen, where he also develops training programs for aeronautics and space business.View more
Author image of Ahmed El Oualkadi
Laboratory of Information Technology and Communication, National School of Applied Sciences of Tangier, Abdelmalek Essaâdi University, Tétouan, Morocco
Ahmed El Oualkadi (M’02) received the Ph.D. degree in electronics from the University of Poitiers, France, in 2004. From 2000 to 2003, he was a Research Assistant with the Laboratoire d’Automatique et d’Informatique Industrielle, Ecole Supérieure d’Ingénieurs de Poitiers, Electronics & Electrostatics Research Unit, University of Poitiers. In 2004, he was an Assistant Professor with the University Institute of Technology, Angoulême, France. In 2005, he joined the Université Catholique de Louvain, Microelectronics Laboratory, Louvain-la-Neuve, Belgium, as a Research Fellow, where he researched the analog and mixed design of low-power high-temperature circuits and systems, in SOI technology, for wireless communication. He has managed and participated in several European and regional projects in the areas of wireless communication and sensor networking. He is currently an Associate Professor with the Abdelmalek Essaadi University, National School of Applied Sciences of Tangier, Morocco. His main research interest is the analog IC, mixed-signal, RFIC, and MMIC design for wireless communication and electronic circuit reliability.
Ahmed El Oualkadi (M’02) received the Ph.D. degree in electronics from the University of Poitiers, France, in 2004. From 2000 to 2003, he was a Research Assistant with the Laboratoire d’Automatique et d’Informatique Industrielle, Ecole Supérieure d’Ingénieurs de Poitiers, Electronics & Electrostatics Research Unit, University of Poitiers. In 2004, he was an Assistant Professor with the University Institute of Technology, Angoulême, France. In 2005, he joined the Université Catholique de Louvain, Microelectronics Laboratory, Louvain-la-Neuve, Belgium, as a Research Fellow, where he researched the analog and mixed design of low-power high-temperature circuits and systems, in SOI technology, for wireless communication. He has managed and participated in several European and regional projects in the areas of wireless communication and sensor networking. He is currently an Associate Professor with the Abdelmalek Essaadi University, National School of Applied Sciences of Tangier, Morocco. His main research interest is the analog IC, mixed-signal, RFIC, and MMIC design for wireless communication and electronic circuit reliability.View more
Author image of Farid Temcamani
ENSEA National School of Electronics and Its Applications, Quartz Laboratory, Cergy Pontoise, France
Farid Temcamani (M’04) received the Ph.D. degree in electronics. He joined the Institut d’Electronique, de Microélectronique et de Nanotechnologie of Lille, Lille, France, in 1985. He worked in the Active Devices Group. His thesis research concerned multiple channel HEMTs for microwave power amplification. In 1991, he joined the ECIME Laboratory, Engineering College, Ecole Nationale Supérieur de l’Electronique et de ses Applications (ENSEA), Cergy-Pontoise, France. Since 2005, he has been a Full Professor and, from 2005 to 2009, he was the Director of the ECIME Laboratory. From 2009 to 2014, he was the Director of the entire research department of ENSEA. He is currently a member of the new Quartz Laboratory. His research interests are in active filtering and power amplification with GaAs, silicon, and wide gap materials devices, and electronic circuit reliability.
Farid Temcamani (M’04) received the Ph.D. degree in electronics. He joined the Institut d’Electronique, de Microélectronique et de Nanotechnologie of Lille, Lille, France, in 1985. He worked in the Active Devices Group. His thesis research concerned multiple channel HEMTs for microwave power amplification. In 1991, he joined the ECIME Laboratory, Engineering College, Ecole Nationale Supérieur de l’Electronique et de ses Applications (ENSEA), Cergy-Pontoise, France. Since 2005, he has been a Full Professor and, from 2005 to 2009, he was the Director of the ECIME Laboratory. From 2009 to 2014, he was the Director of the entire research department of ENSEA. He is currently a member of the new Quartz Laboratory. His research interests are in active filtering and power amplification with GaAs, silicon, and wide gap materials devices, and electronic circuit reliability.View more

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