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Device and Materials Reliability, IEEE Transactions on


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Frequency: 4

ISSN: 1530-4388

Subject Category: Electron Devices

Published by: IEEE Electron Devices Society
IEEE Reliability Society

Visit the Website: IEEE Transactions on Device and Materials Reliability

Persistent Link (OPAC): http://ieeexplore.ieee.org/servlet/opac?punumber=7298 » Learn more

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Aims and Scope

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials.

Contacts

Editor-in-Chief Anthony S. Oates Taiwan Semiconductor Mfg Co. 9 Creation Rd 1 Science Based Industrial Park Hsinchu, 300-77, Taiwan Phone: 011 886 3 566 6090 Fax: 011 886 3 578 1064 Email: aoates@tsmc.com	Jo Ann Marsh IEEE/EDS Publications Office 445 Hoes Lane Piscataway, NJ 08854, USA Fax: +1 732-562-6831 Email: j.marsh@ieee.org

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