CD-RAIS: Constrained dynamic striping in redundant array of independent SSDs | IEEE Conference Publication | IEEE Xplore

CD-RAIS: Constrained dynamic striping in redundant array of independent SSDs


Abstract:

Solid state drives (SSDs) are increasingly deployed to construct storage arrays (RAIDs) in enterprise environments. The design decisions in RAID are traditionally devised...Show More

Abstract:

Solid state drives (SSDs) are increasingly deployed to construct storage arrays (RAIDs) in enterprise environments. The design decisions in RAID are traditionally devised for HDD RAIDs, which cannot fully exploit the characteristics of SSDs. In particular, SSD lacks the ability to update pages in-place. Random writes in traditional parity-based RAIS (SSD RAID) systems that has static striping result in significantly more writes, degraded performance, and shortened SSD lifetime. By dynamically forming full stripes, log-based design originally proposed in HDD RAID can mitigate the write-hole problem caused by random writes. However, it needs a directory to record locations for all data blocks, resulting in large space overhead and consequently sacrificing addressing efficiency. In this paper, we propose CD-RAIS, a compromise between static striping and dynamic striping. CD-RAIS groups requests that are from different SSD drives and places their corresponding unnecessarily consecutive logical blocks in one stripe. It mitigates the write-hole problem, meanwhile remains the same addressing efficiency as static striping. To enable dynamic data striping fit SSDs, CD-RAIS performs lazy data invalidation and consolidates updates to parity blocks. CD-RAIS greatly alleviates the write request increase due to parity block update in RAIS. Our experimental results show that, for random write dominated workloads, CD-RAIS achieves 65% response time improvement and 31% longer SSD lifespan over traditional RAIS schemes.
Date of Conference: 22-26 September 2014
Date Added to IEEE Xplore: 01 December 2014
Electronic ISBN:978-1-4799-5548-0

ISSN Information:

Conference Location: Madrid, Spain

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