Abstract:
We report characterization of low-loss MgO-TiO2 system ceramic materials in the 75–110 GHz (W-band) and 0.5–18 GHz frequency ranges. Measurements of the complex permittiv...Show MoreMetadata
Abstract:
We report characterization of low-loss MgO-TiO2 system ceramic materials in the 75–110 GHz (W-band) and 0.5–18 GHz frequency ranges. Measurements of the complex permittivity are used to study the dielectric constant, loss tangent, and DC conductivity (low-frequency) behavior of the materials for application in millimeter-wave vacuum electron devices. We investigate the effects of varying ceramic synthesis process parameters on the rf material properties.
Published in: IEEE International Vacuum Electronics Conference
Date of Conference: 22-24 April 2014
Date Added to IEEE Xplore: 17 July 2014
Electronic ISBN:978-1-4799-3426-3
