A Framework to Manage Knowledge from Defect Resolution Process | IEEE Conference Publication | IEEE Xplore

A Framework to Manage Knowledge from Defect Resolution Process


Abstract:

This paper presents a framework for the management, the processing and the reuse, of information relative to defects. This framework is based on the fact that each defect...Show More

Abstract:

This paper presents a framework for the management, the processing and the reuse, of information relative to defects. This framework is based on the fact that each defect triggers a resolution process in which information about the detected incident (i.e. the problem) and about the applied protocol to resolve it (i.e. the solution) is collected. These different types of information are the cornerstone of the optimization of corrective and preventive processes for new defects. Experimentations show that our prototype provides a very satisfactory quality of results with good performances.
Date of Conference: 05-07 September 2011
Date Added to IEEE Xplore: 17 October 2011
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Conference Location: Luxembourg-Kirchberg, Luxembourg

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