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Calculating error of measurement on high speed microprocessor test | IEEE Conference Publication | IEEE Xplore

Calculating error of measurement on high speed microprocessor test


Abstract:

Accuracy and precision are desirable properties of any test process. Understanding test process capability can help ensure that high speed microprocessors are binned at t...Show More

Abstract:

Accuracy and precision are desirable properties of any test process. Understanding test process capability can help ensure that high speed microprocessors are binned at their proper speed. This paper discusses a practical example of how a designed experiment was used to determine the test process speed sorting error of measurement of the Alpha AXP, the industry's fastest microprocessor, tested at Digital Equipment Corporation's Hudson, MA manufacturing site. Knowing error of measurement allowed effective guardbands to be established to guarantee specified performance in the context of the supplier's and consumer's risks. A series of test process improvements resulted from the follow-up work suggested by the experiment.
Date of Conference: 02 October 1995 - 06 October 1994
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-2103-0
Print ISSN: 1089-3539
Conference Location: Washington, DC, USA

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