All Tests for a Fault are Not Eyually Valuable for Defect Detection | IEEE Conference Publication | IEEE Xplore

All Tests for a Fault are Not Eyually Valuable for Defect Detection

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First Page of the Article

Published in: Proceedings International Test Conference 1992

Date of Conference: 20-24 September 1995

Date Added to IEEE Xplore: 06 August 2002

Print ISBN:0-7803-0760-7

Print ISSN: 1089-3539

DOI: 10.1109/TEST.1992.527898

Conference Location: Baltimore, MD, USA

First Page of the Article

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