Loading [MathJax]/extensions/MathMenu.js
Automatic test equipment | IET Journals & Magazine | IEEE Xplore

Automatic test equipment


Abstract:

As electronic circuits and systems have increased in complexity in recent years, so has the need to develop more sophisticated and easy-to-use automatic test equipment. T...Show More

Abstract:

As electronic circuits and systems have increased in complexity in recent years, so has the need to develop more sophisticated and easy-to-use automatic test equipment. The first generation of a.t.e, designed to stimulate circuit elements and examine outputs, has given way to guided-probe systems, which are resembling more and more closely the behaviour of skilled test technicians
Published in: Electronics and Power ( Volume: 23, Issue: 1, January 1977)
Page(s): 44 - 48
Date of Publication: January 1977
Print ISSN: 0013-5127

Contact IEEE to Subscribe