A CMOS Image Sensor with row and column profiling means | IEEE Conference Publication | IEEE Xplore

A CMOS Image Sensor with row and column profiling means


Abstract:

This paper describes the implementation and first measurement results of a new way that obtains row and column profile data from a CMOS Image Sensor, which is developed f...Show More

Abstract:

This paper describes the implementation and first measurement results of a new way that obtains row and column profile data from a CMOS Image Sensor, which is developed for a micro-Digital Sun Sensor (μDSS).The basic profiling action is achieved by the pixels with p-type MOS transistors which realize a so-called “Winner Takes It All (WTIA) [1][2]” principle. The WTIA implementation improves the μDSS system greatly on speed and power consumption. In this way the sensor is ideally suited for a digital sun sensor intended for astronomy applications.
Published in: SENSORS, 2008 IEEE
Date of Conference: 26-29 October 2008
Date Added to IEEE Xplore: 16 December 2008
ISBN Information:
Print ISSN: 1930-0395
Conference Location: Lecce, Italy
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