Abstract:
We performed characterization of boron nitride thin films made by femtosecond pulsed laser deposition. FT-IR and electron diffraction analysis indicated the content of wu...Show MoreMetadata
Abstract:
We performed characterization of boron nitride thin films made by femtosecond pulsed laser deposition. FT-IR and electron diffraction analysis indicated the content of wurtzite boron nitride phase, for the first time to our best knowledge.
Published in: 2005 Pacific Rim Conference on Lasers & Electro-Optics
Date of Conference: 14-14 July 2005
Date Added to IEEE Xplore: 10 January 2006
Print ISBN:0-7803-9242-6
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