On peculiarities of S-parameter measurements | IEEE Conference Publication | IEEE Xplore

On peculiarities of S-parameter measurements


Abstract:

Measured S-parameters are a key factor in many measurement and/or modeling applications. Experience teaches that quantities that are derived from the measurements can con...Show More

Abstract:

Measured S-parameters are a key factor in many measurement and/or modeling applications. Experience teaches that quantities that are derived from the measurements can contain spikes, and that they tend to grow with connection imperfections. In this paper, a possible theory is provided and the presence of the peaks is shown in practical measurements. The measured propagation constant (/spl gamma/((/spl omega/)) and characteristic impedance (Z/sub 0/(/spl omega/)) of a transmission line are used as an illustrative example.
Date of Conference: 17-17 June 2005
Date Added to IEEE Xplore: 29 August 2005
Print ISBN:0-7803-8858-5
Conference Location: Long Beach, CA, USA

Contact IEEE to Subscribe

References

References is not available for this document.