Abstract:
The traditional debug tools for chip tests and software developments need huge investment and plenty of time. These problems can be overcome by an embedded debugger based...Show MoreMetadata
Abstract:
The traditional debug tools for chip tests and software developments need huge investment and plenty of time. These problems can be overcome by an embedded debugger based the JTAG boundary scan architecture. Thus, the IEEE 1149.1 standard is adopted by ASIC designers for testability problems. We designed the RED (reusable embedded debugger) using the JTAG boundary scan architecture. The proposed debugger is applicable for not only chip test but also software debugging. Our debugger has an additional hardware module (EICEM: embedded ICE module) for more critical real-time debugging.
Published in: Proceedings. IEEE Asia-Pacific Conference on ASIC,
Date of Conference: 08-08 August 2002
Date Added to IEEE Xplore: 07 November 2002
Print ISBN:0-7803-7363-4