Abstract:
Different real world scenarios which may cause stress voltages on USB connected devices are investigated. This study identifies ESD discharge scenarios and their respecti...Show MoreMetadata
Abstract:
Different real world scenarios which may cause stress voltages on USB connected devices are investigated. This study identifies ESD discharge scenarios and their respective current and voltage levels, stress duration and the rise times for different USB cable shield types.
Date of Conference: 10-14 September 2017
Date Added to IEEE Xplore: 19 October 2017
ISBN Information:
Contents 