Loading [a11y]/accessibility-menu.js
Dummy transistor compensation of analog MOS switches | IEEE Journals & Magazine | IEEE Xplore

Dummy transistor compensation of analog MOS switches


Abstract:

Theoretical and experimental results of the clock-feedthrough phenomenon (charge injection) in sample-and-hold circuits using minimum features size transistors of a self-...Show More

First Page of the Article

Abstract:

Theoretical and experimental results of the clock-feedthrough phenomenon (charge injection) in sample-and-hold circuits using minimum features size transistors of a self-aligned 3 mu m CMOS technology are compared. The lumped RC model of the conductive channel is used and verified in different switch configurations with variable input voltages. Special emphasis is placed on the feasibility and limits of charge cancellation techniques using dummy switches.<>
Published in: IEEE Journal of Solid-State Circuits ( Volume: 24, Issue: 4, August 1989)
Page(s): 1143 - 1146
Date of Publication: 31 August 1989

ISSN Information:

First Page of the Article


Contact IEEE to Subscribe

References

References is not available for this document.