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IEEE Spectrum

Volume 14 Issue 4 • April 1977

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Displaying Results 1 - 25 of 25
  • [Advertisement]

    Publication Year: 1977, Page(s):1 - 2
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  • Contents

    Publication Year: 1977, Page(s): 1
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  • [Advertisement]

    Publication Year: 1977, Page(s):2 - 5
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  • Calendar

    Publication Year: 1977, Page(s): 6
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  • News from Washington

    Publication Year: 1977, Page(s): 7
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  • Energy report

    Publication Year: 1977, Page(s):8 - 9
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  • Forum

    Publication Year: 1977, Page(s):10 - 13
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  • Tools & toys

    Publication Year: 1977, Page(s):14 - 16
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  • Inside IEEE

    Publication Year: 1977, Page(s):17 - 24b
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    In an unusually substantive two-day meeting on February 19-20, in Washington, D.C., IEEE's Board of Directors took several actions that could have major consequences for the Institute in the near future. The Board not only nominated its candidates for 1978 President and Executive Vice President (see March Spectrum) but, working largely in open session for the first time in Institute history, it to... View full abstract»

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  • Spectral lines: Over (or under) 40 and out (or in)

    Publication Year: 1977, Page(s):25 - 26
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (3690 KB)

    Listen to this manager speaking: —When crunch time comes, my best engineers help me to try to save the department — my worst people try to save themselves. It's too bad, but it's usually too late for the `losers´ _ who invariably have no trouble in identifying themselves.“ Another manager disagrees ” somewhat. “It's not that simple. There are at least three categories: my best people I really want... View full abstract»

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  • Tougher jobs, tougher instruments: More complex measurement problems are being solved by microprocessors, bussed systems, and software

    Publication Year: 1977, Page(s):27 - 28
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    More complex electronic test and measurement instruments which are being solved by microprocessors, bussed systems, and software. View full abstract»

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  • ATE: Not so easy: As components and subsystems become more complex, automatic testing grows difficult and costly

    Publication Year: 1977, Page(s):29 - 36
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (6031 KB)

    Discusses briefly the technological development in automatic electronic circuit board testing. The subjects mentioned include LSI PCB testing, software generated tests, diagnostic software, and fault detector. View full abstract»

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  • Analog tests: the microprocessor scores

    Publication Year: 1977, Page(s):37 - 42
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    The complexity and cost of making analog measurements can be reduced by the use of a microprocessor. Benefits derived include simplicity of measurements, use of cheaper components, and worthwhile results from `meaningless' data. View full abstract»

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  • The 'safety factor' in test equipment

    Publication Year: 1977, Page(s):43 - 47
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    Discusses briefly the safety standard requirement and improvement in test equipment. View full abstract»

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  • Rent-an-instrument

    Publication Year: 1977, Page(s):48 - 52
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    Describes the development of instrument rental industry, and discusses why and what it can offer. View full abstract»

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  • U.S. shows stage a comeback: A shell game played without a pea, the electronics exhibition is prey to economics and psychology

    Publication Year: 1977, Page(s):53 - 55
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (3579 KB)

    On the occasion of its Golden Anniversary, IEEE's premiere annual convention — called INTERCON after the AIEE/IRE merger — passed away, only to be reborn as ELECTRO. Once internationally recognized as one of the largest and most successful conventions and exhibitions of its kind, INTERCON in 1976 gave way to a primarily regional show, ELECTRO, that in alternating years moves between Boston, Mass. ... View full abstract»

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  • Electro '77: A three-ring circus: The vital statistics: 300 exhibitors, 42 sessions, and an expected 25 000 attendees

    Publication Year: 1977, Page(s):56 - 66
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  • New product applications

    Publication Year: 1977, Page(s):67 - 72
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  • Spectrum's hardware review

    Publication Year: 1977, Page(s): 73
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  • Applications literature

    Publication Year: 1977, Page(s):74 - 75
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  • Book reviews

    Publication Year: 1977, Page(s):76 - 80
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  • News from industry

    Publication Year: 1977, Page(s): 81
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  • News from region 1

    Publication Year: 1977, Page(s): 82
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  • Meetings

    Publication Year: 1977, Page(s):83 - 88
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  • In future issues

    Publication Year: 1977, Page(s):89 - 92
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IEEE Spectrum Magazine, the flagship publication of the IEEE, explores the development, applications and implications of new technologies.

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Editor-in-Chief
Susan Hassler
IEEE Spectrum Magazine