IEEE Transactions on Component Parts

Includes the top 50 most frequently accessed documents for this publication according to the usage statistics for the month of

  • Electronic Component Parts Failure Rates and Failure Mechanism Research in the United Kingdom

    Publication Year: 1964, Page(s):333 - 351
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2120 KB)

    Failure rates have been collected at the Royal Radar Establishment since 1944 and continuous records of failures in radar equipments undergoing environmental testing have been maintained. The effect of environment on failure rates was investigated as early as 1945 and M.T.B.F's of 116 hours in England and Europe, 61 hours in the Mediterranean and 18 hours in the tropics were obtained in that year.... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Hysteresis Loop Analysis

    Publication Year: 1963, Page(s):115 - 118
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (512 KB)

    The apparent hysteresis loop of a square loop magnetic material is affected by winding capacitance, shorted turns, air gap, and strain. The effects of these parameters on an oscilloscopic display of the dynamic hysteresis loop are demonstrated. View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Inductor Size vs. Q: A Dimensional Analysis

    Publication Year: 1963, Page(s):31 - 35
    Cited by:  Papers (13)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (608 KB)

    Equations are derived and curves are plotted showing the change in Q of an inductor as a function of a change in size. The approach used is to assume the existence of a model having a fixed inductance and operating under a fixed set of conditions. A change in size is introduced by a magnification-type enlargement or shrinkage of all outline dimensions by the factor "a." Assuming a constant effecti... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Application of Capacitors in Low Frequency and Long Time Constant Circuits

    Publication Year: 1964, Page(s):216 - 219
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (456 KB)

    This paper discusses the low frequency (less than 1 cps) and long time constant applications and testing of capacitors as used in analog control systems. Emphasis is placed on tantalum electrolyric types, as they provide the necessary volume efficiency for airborne systems. The effective capacitance is always larger at the low frequencies than at normal capacitance bridge measuring frequencies. Th... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Application of the Eyring Model to Capacitor Aging Data

    Publication Year: 1965, Page(s):34 - 41
    Cited by:  Papers (68)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1248 KB)

    The Eyring Model has been used to derive the "power rule" for capacitors. Analytical models for evaluating progressive and step stress tests are presented. Various methods are discussed for determining the value of the exponent for the power rule. In particular, the relation between the exponent of the power rule and the beta of the Weibull distribution, for both progressive and constant stress te... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Dielectric Properties of Thin Insulating Films of Photoresist Material

    Publication Year: 1965, Page(s):8 - 11
    Cited by:  Papers (4)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (576 KB)

    This paper discusses measurements of the dielectric properties of thin insulating films of AZ-171and KPR.2The properties include conductivity and dielectric constant as a function of frequency, voltage, and temperature. Also, films have been temperature cycled from 3° to 500° K to determine if structural defects appear. These measurements show that specially prepare... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Interconnection Techniques for Microcircuits

    Publication Year: 1964, Page(s):33 - 41
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (2344 KB)

    The problem of how to interconnect today and tomorrow's microminiature electronic circuit packages is one which is growing increasingly complex in view of the ever-diminishing size factor. It appears, however, that within a period of a few short years, many ingenious solutions to the interconnection problem have evolved. Some of these microcircuit interconnection techniques have proven their merit... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Dielectric Breakdown in Solid Electrolyte Tantalum Capacitors

    Publication Year: 1964, Page(s):187 - 193
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (792 KB)

    The construction of solid electrolyte tantalum capacitors is described briefly. The evidence for flaws in the oxide dielectric is presented and the leakage current flowing during the early stages of breakdown is discussed. A consideration of the variation of breakdown voltage with temperature and time of apolication of voltage leads to the conclusion that thermal breakdown is responsible for failu... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Slow Discharge in Insulators

    Publication Year: 1964, Page(s):212 - 215
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (288 KB)

    First Page of the Article
    View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Storage of Electronic Components and Equipment

    Publication Year: 1964, Page(s):225 - 237
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1472 KB)

    The problem of "storage" of electronic parts and equipment first came into focus with the publication of the AGREE Committee Report on Task 8 in 1957. At that time, this problem was recognized as having important logistics connotations. For logistics planning, it was necessary to know what would be the failure rate of components and equipments when they were "on-the-shelf" for a long interval of t... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Optimized Design of Transformers for Application in Silicon Controlled Rectifier Extinction and Ignition Circuits

    Publication Year: 1963, Page(s):36 - 47
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1632 KB)

    In recent years the evolution of more sophisticated military avionic systems has required a corresponding reduction in component size and an increase in component life, precision, and reliability. To satisfy these more difficult design requirements, silicon solid-state devices are being used more extensively in power switching applications. Silicon controlled rectifiers (SCR's) can be used in plac... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • The Plasma Oxidation of Metals in Forming Electronic Circuit Components

    Publication Year: 1964, Page(s):1 - 4
    Cited by:  Papers (5)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (472 KB)

    This study involves the fabrication of tantalum-pentoxide capacitors by other than the conventional thermal or aqueous electrolytic techniques. A new method of dielectric formation is described, and some of the results of the measurements performed on the passive devices are presented. This plasma-anodic process is then compared to the aqueous anodic processes, with the emphasis upon the compatibi... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A New Approach to the Attainment of the Highest Possible Reliability in Tantalum Capacitors

    Publication Year: 1965, Page(s):21 - 29
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1488 KB)

    The question of how to achieve the highest possible reliability for Tantalum capacitors is discussed from both the theoretical and practical point of view. A method of achieving reliabilities of the order 95 per cent at a confident level of 95 per cent or better is described which involves an analytical treatment of the physics of the main mode of failure, all accounting for over 90 per cent of a ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • The Effect of Moisture on Molded Composition Resistors

    Publication Year: 1963, Page(s):113 - 115
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (352 KB)

    Moisture problems have perennially plagued the use of the electrical and electronic products. Carbon composition resistors represent a widely used component which must withstand the effects of moisture. Continual improvements in construction and materials have made this possible. To illustrate and magnify the changes that occur in commercial composition resistors with moisture exposure, molded res... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Synthesis of Multiple Resistance Networks from Single Resistive Films

    Publication Year: 1963, Page(s):147 - 155
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1056 KB)

    A design procedure is described whereby multiple resistance networks can be synthesized from a single layer, monolithic, resistive structure. The method is illustrated by detailing the design of attenuators operating on an image-impedance basis. The single sheet geometry used is a rectangle with conducting tabs placed on its boundary. Conformal transformation techniques are applied to facilitate t... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Thin Film Capacitor Parameter Studies

    Publication Year: 1964, Page(s):194 - 204
    Cited by:  Papers (4)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1120 KB)

    A discussion is presented relating the electrical, optical and physical parameters of thin film capacitors. A study of silicon monoxide dielectric films has been conducted. Both the electrical and optical characteristics were investigated in a series of planned experiments. A relationship between dielectric constant, refractive index and the thin film vacuum deposition parameters of the dielectric... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Current-Voltage Relations for Thin-Film Tunneling Structures

    Publication Year: 1964, Page(s):9 - 15
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1056 KB)

    Current-voltage characteristics have been calculated for a structure consisting of two metal surfaces separated by a thin film of "insulating" material. The analysis includes both tunneling and thermionic emission, and takes account of dielectric constant and image force. Curves of current density vs field strength are presented for various values of barrier height and dielectric constant. Several... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Research Toward a Physics of Aging of Silicon P-N Junctions

    Publication Year: 1964, Page(s):28 - 32
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (776 KB)

    As part of the Electronic Component Reliability Center at Battelle Memorial Institute an experimental program has been initiated, the goal of which is to develop an approach to reliability prediction based on an understanding of the physical processes responsible for degradation of performance characteristics of electronic component parts. A modification of the Eyring rate equation, accounting for... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Prediction of Diode Degradation in Transistors by Measurement of Time Response

    Publication Year: 1964, Page(s):378 - 384
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (528 KB)

    One of the major modes of failure in germanium alloy power transistors is collector diode degradation. It has been found that the time response of the collector diode, measured initially, is a strong indicator of later degradation failure. The "0" hour time varying characteristic of a potential failure is explained by a proposed model which involves an ionic charge separation phenomenon. This phen... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.

Aims & Scope

This Transaction ceased production in 1965. The current publication is titled IEEE Transactions on Components, Packaging, and Manufacturing Technology.

Full Aims & Scope