IBM Journal of Research and Development

Volume 55 Issue 4 • July-Aug. 2011

Cathode Lens Microscopy for Nanoscience

This issue of the IBM journal describes recent advances in the field of nanoscience, with an emphasis on cathode lens-based microscopy methods, including LEEM (low-energy electron microscopy), PEEM (photoemission electron microscopy), and other related analytical approaches. Papers highlight scientific advances and instrumental developments on topics that include thin films, organic films, surface chemistry, magnetism, time-resolved methods, and various novel applications of microscopy in material science.

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Rachel D'Annucci Henriquez
IBM T. J. Watson Research Center