# IEEE Transactions on Reliability

## Filter Results

Displaying Results 1 - 25 of 26
• ### [Front cover]

Publication Year: 1971, Page(s): c1
| PDF (730 KB)
• ### IEEE Reliability Group

Publication Year: 1971, Page(s): nil1
| PDF (134 KB)
• ### [Breaker page]

Publication Year: 1971, Page(s): nil1
| PDF (134 KB)
• ### Say What You Mean

Publication Year: 1971, Page(s): 203
| PDF (136 KB)
• ### Confidence Limits for System Reliability: A Sequential Method

Publication Year: 1971, Page(s):204 - 211
Cited by:  Papers (10)
| | PDF (1136 KB)

A sequential method is given for obtaining confidence limits for system reliability when pass-fail'' test data have been obtained on components. Costs of testing are examined and a rule is derived for determining the order in which to test the components so that the average cost of testing is minimized. The method is presented first for series systems, but in Section IV the extension to parallel... View full abstract»

• ### Probability Limits for Life Test Data

Publication Year: 1971, Page(s):212 - 216
Cited by:  Papers (2)
| | PDF (882 KB)

In this paper a general theory for constructing probability limits for life test data is briefly discussed. It is then applied to a set of life test data to determine which of three specified Weibull distributions give the best fit. View full abstract»

• ### Reliability Analysis of Systems Comprised of Units with Arbitrary Repair-Time Distributions

Publication Year: 1971, Page(s):217 - 223
Cited by:  Papers (31)
| | PDF (1195 KB)

This work demonstrates the feasibility of reliability modeling of systems with repair capability using a semi-Markov process. A two-unit system with exponential failure times but general repair times is studied. Formulas for state-transition probabilities, waiting-time distribution functions, and mean time in each state are developed. These quantities are expressed in terms of the Laplace transfor... View full abstract»

• ### Reliability Prediction Studies of Complex Systems Having Many Failed States

Publication Year: 1971, Page(s):223 - 230
Cited by:  Papers (5)
| | PDF (1065 KB)

In this paper, the theory of discrete Markov processes is used to develop methods for predicting the reliability and moments of the first time to failure of complex systems having many failed states. It is assumed that these complex systems operate in a repair environment and are composed of subsystems that have known constant failure and repair rates. Specifically, complex systems composed of any... View full abstract»

• ### The Maximum Error in System Reliability Calculations by Using a Subset of the Minimal States

Publication Year: 1971, Page(s):231 - 234
Cited by:  Papers (14)
| | PDF (717 KB)

The reliability of a system is evaluated from information about the minimal states, using Poincare's method (inclusion-exclusion). An equation is derived using the minimal paths, which gives the reliability (the probability of system success) as a function of the reliabilities of the components; the unreliability or probability of system failure is obtained by subtracting this from one. Dually, wi... View full abstract»

• ### Tables to Facilitate Calculation of an Asymptotically Optimal t Test for Equality of Location Parameters of a Certain Extreme-Value Distribution

Publication Year: 1971, Page(s):235 - 243
Cited by:  Papers (2)
| | PDF (932 KB)

A t test, proposed by Ogawa and based on the use of a few sample quantiles selected from large samples, is considered for testing the hypothesis H0: μ1 = μ2 against the hypothesis H1: μ1 ≠ μ2 concerning the location parameters μ1 and μ2 of two extreme-valu... View full abstract»

• ### Product Reliability and Random Fatigue

Publication Year: 1971, Page(s):244 - 248
Cited by:  Papers (2)
| | PDF (639 KB)

The fatigue life of a mechanical component in a conventional ional test situation depends upon the stress amplitude. A change in the stress amplitude during a laboratory test-program involves a consideration of the damage produced by each stress cycle imposed upon the test specimen. A direct extension of this elementary concept to irregular stress waveforms provides a logical basis for a statistic... View full abstract»

• ### Reliability Criteria when Standardizing High Contact Density Connectors

Publication Year: 1971, Page(s):249 - 253
| | PDF (2433 KB)

The following paper presents the results of a comparative reliability study conducted on three tpes of high density circular connectors, conforming to NAS 1599, MIL. C. 38 999, and MIL. C. 81 511. After runing numerous relability tests, Souriau has been able to develop a highly successful high density connector. View full abstract»

• ### Reliability of Two Items in Sequence with Sensing and Switching

Publication Year: 1971, Page(s):254 - 256
Cited by:  Papers (11)
| | PDF (397 KB)

This paper discusses a mathematical model of a redundant device consisting of an active item, a standby item, and a failure-sensing switch. It is assumed that the failure rate of the standby item is less than that of the active item and that there is no repair. The results obtained for the reliability of the device represent several improvements over known results. View full abstract»

• ### A Direct Method for Maximizing the System Reliability

Publication Year: 1971, Page(s):256 - 259
Cited by:  Papers (52)
| | PDF (587 KB)

A simple computational procedure has been developed for allocating redundancy among subsystems so as to achieve maximum reliability of a multistage system subject to multiple constraints which need not be linear. The computational time is quite short. Two examples are shown. View full abstract»

• ### The Digital Computer in Medical Electronics

Publication Year: 1971, Page(s):259 - 260
| | PDF (470 KB)

First Page of the Article
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• ### Comment on "Psychological Reliability" - Man-Machine Systems

Publication Year: 1971, Page(s):260 - 261
| | PDF (520 KB)

First Page of the Article
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Publication Year: 1971, Page(s): 261
| | PDF (255 KB)

First Page of the Article
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• ### Comments on "Definitions of Reliability

Publication Year: 1971, Page(s): 261
| | PDF (255 KB)

First Page of the Article
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• ### Further Comments on Definitions of Reliability''

Publication Year: 1971, Page(s):261 - 262
| | PDF (482 KB)

First Page of the Article
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• ### Editor's Note

Publication Year: 1971, Page(s): 262
| PDF (238 KB)
• ### Book Reviews

Publication Year: 1971, Page(s):262 - 264
| PDF (760 KB)
• ### Contributors

Publication Year: 1971, Page(s):264 - 265
| PDF (487 KB)
• ### List of referees

Publication Year: 1971, Page(s): 266
| PDF (85 KB)
• ### 1971 Index IEEE Transactions on Reliability Vol. R-20

Publication Year: 1971, Page(s):267 - 271
| PDF (1138 KB)

Publication Year: 1971, Page(s): nil5
| PDF (126 KB)

## Aims & Scope

IEEE Transactions on Reliability is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it.

Full Aims & Scope

## Meet Our Editors

Editor-in-Chief
W. Eric Wong
University of Texas at Dallas
Advanced Res Ctr for Software Testing and Quality Assurance

ewong@utdallas.edu