IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Volume 21 Issue 12 • Dec. 2002
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3-D Thermal-ADI: a linear-time chip level transient thermal simulator
Publication Year: 2002, Page(s):1434 - 1445
Cited by: Papers (112) | Patents (15)Recent study shows that the nonuniform thermal distribution not only has an impact on the substrate but also interconnects. Hence, three-dimensional (3-D) thermal analysis is crucial to analyze these effects. In this paper, the authors present and develop an efficient 3-D transient thermal simulator based on the alternating direction implicit (ADI) method for temperature estimation in a 3-D enviro... View full abstract»
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Digital filter synthesis based on an algorithm to generate all minimal signed digit representations
Publication Year: 2002, Page(s):1525 - 1529
Cited by: Papers (51)In this paper, the authors propose an algorithm to find all the minimal signed digit (MSD) representations of a constant and present an algorithm to synthesize digital filters based on the MSD representation. The hardware complexity of a digital signal processing system is dependent on the number system used for the implementation. Although the canonical signed digit (CSD) representation is widely... View full abstract»
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Test vector generation for charge sharing failures in dynamic logic
Publication Year: 2002, Page(s):1502 - 1508Dynamic logic is increasingly becoming a logic type of choice for designs requiring high speed and low area. Charge sharing is one of many problems that may cause failure in dynamic logic circuits due to their low noise immunity. The authors address the charge-sharing noise issue. Specifically, they develop an accurate but tractable model for analyzing charge sharing that avoids costly Hspice simu... View full abstract»
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Renormalization group meshes and the discretization of TCAD equations
Publication Year: 2002, Page(s):1425 - 1433
Cited by: Papers (3)This paper presents a new method to discretize the equations for the physical modeling of semiconductor devices and back-end patterns. The method assembles planes in two dimensions and cubes in three dimensions and allows for adaptive meshing without the occurrence of spurious nodes due to mesh smoothing. Whereas the applications that are discussed focus on the design of microelectronic devices, t... View full abstract»
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Formulating SoC test scheduling as a network transportation problem
Publication Year: 2002, Page(s):1517 - 1525
Cited by: Papers (22) | Patents (1)A formulation of core-based system-on-chip (SoC) test scheduling as a network transportation problem is presented. Given a set of tests, with demands for transportation of test bits (either for test stimuli or test response) and unrelated parallel test resources (e.g., test access mechanisms or built-in self-test engines), the authors determine the start times and resource mappings of all the test... View full abstract»
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Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications
Publication Year: 2002, Page(s):1497 - 1502
Cited by: Papers (8)Electrostatic discharge (ESD) is a critical reliability concern for microchips. This paper presents a comprehensive computer-aided design tool for ESD applications. Specifically, the authors develop an improved and robust MOS model and implement such a model into the industry standard Cadence SPICE for ESD circuit simulation. The key components relevant to ESD in the MOS model are studied and the ... View full abstract»
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Analytical approach to layout generation of datapath cells
Publication Year: 2002, Page(s):1480 - 1488
Cited by: Patents (2)This paper addresses the problem of layout automation of datapath cells. It presents an analytical approach to transistor placement under full custom design style and demonstrates that it can be applied to practical datapath designs. The presented approach is based on a mathematical model which employs a mixed integer linear programming technique. The placement algorithm adopts the custom design t... View full abstract»
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Crosstalk alleviation for dynamic PLAs
Publication Year: 2002, Page(s):1416 - 1424
Cited by: Papers (6)The dynamic programmable logic array (PLA) style has become popular in designing high-performance microprocessors because of its high speed and predictable routing delay. However, like all other dynamic circuits, dynamic PLAs have suffered from the crosstalk noise problem. The main reason is that the regularity of the PLA design style causes a product line parallel to the adjacent product lines on... View full abstract»
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SPIRIT: a highly robust combinational test generation algorithm
Publication Year: 2002, Page(s):1446 - 1458
Cited by: Papers (24)In this paper, an efficient test pattern generation (TPG) algorithm for combinational circuits based on the Boolean satisfiability method (SAT) is presented. The authors propose a new data structure for the complete implication graph that increases the precision of implication process. Next, they examine approaches like a single-cone processing, single path-oriented propagation, and backward justi... View full abstract»
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Design of hierarchical cellular automata for on-chip test pattern generator
Publication Year: 2002, Page(s):1530 - 1539
Cited by: Papers (5)This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field GF(2(pqr..)), where each cell of the CA can store and process a symbol in the extension field GF (2(pqr..)). The hierarchical field structure of GF(2(pqr..)) is employed for design of an HCA-based test pattern generator (HCATPG). The HCATPG is ideally suited for... View full abstract»
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Concurrent error detection schemes for fault-based side-channel cryptanalysis of symmetric block ciphers
Publication Year: 2002, Page(s):1509 - 1517
Cited by: Papers (84) | Patents (9)Fault-based side-channel cryptanalysis is very effective against symmetric and asymmetric encryption algorithms. Although straightforward hardware and time redundancy-based concurrent error detection (CED) architectures can be used to thwart such attacks, they entail significant overheads (either area or performance). The authors investigate systematic approaches to low-cost low-latency CED techni... View full abstract»
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Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system
Publication Year: 2002, Page(s):1489 - 1497
Cited by: Papers (24)As very large scale integration (VLSI) circuit speed rapidly increases, the inductive effects of interconnect lines strongly impact the signal integrity of a circuit. Since these inductive effects make the signal integrity problems much more serious as well as intricate, they become one of the critical issues in today's high-speed/high-density VLSI circuit design. In this paper, a generalized trav... View full abstract»
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A framework for testing special-purpose memories
Publication Year: 2002, Page(s):1459 - 1468Current memory testing methods rely on fault models that are inadequate to accurately represent potential defects that occur in modern, often specialized, memories. To remedy this, the authors present a formal framework for modeling and testing special-purpose memories. Their approach uses three models: the transistor circuit, the event-sequence model, and finite-state machines. The methodology is... View full abstract»
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Robust Boolean reasoning for equivalence checking and functional property verification
Publication Year: 2002, Page(s):1377 - 1394
Cited by: Papers (94) | Patents (9)Many tasks in computer-aided design (CAD), such as equivalence checking, property checking, logic synthesis, and false paths analysis, require efficient Boolean reasoning for problems derived from circuits. Traditionally, canonical representations, e.g., binary decision diagrams (BDDs), or structural satisfiability (SAT) methods, are used to solve different problem instances. Each of these techniq... View full abstract»
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Design rewiring using ATPG
Publication Year: 2002, Page(s):1469 - 1479
Cited by: Papers (17) | Patents (1)Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints such as area, power, or delay. Recently, automated test pattern generation (ATPG)-based design rewiring techniques for technology-dependent logic optimization have gained increasing popularity. In this paper, the authors propo... View full abstract»
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RS-FDRA: A register-sensitive software pipelining algorithm for embedded VLIW processors
Publication Year: 2002, Page(s):1395 - 1415
Cited by: Papers (2)The paper proposes a novel software-pipelining algorithm, Register-Sensitive Force-Directed Retiming Algorithm (RS-FDRA), suitable for optimizing compilers targeting embedded very large instruction word processors. The key difference between RS-FDRA and previous approaches is that this algorithm can handle code-size constraints along with latency and resource constraints. This capability enables t... View full abstract»
Aims & Scope
The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components.
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