Volume 15 Issue 2 • Feb. 1978

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  • [Advertisement]

    Publication Year: 1978, Page(s):1 - 2
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  • Contents

    Publication Year: 1978, Page(s): 1
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  • [Advertisement]

    Publication Year: 1978, Page(s):2 - 5
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  • Conference calendar

    Publication Year: 1978, Page(s):6 - 9
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  • Forum

    Publication Year: 1978, Page(s):10 - 16b
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  • News from Washington

    Publication Year: 1978, Page(s): 17
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  • Energy report

    Publication Year: 1978, Page(s): 18
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  • EEs' tools & toys

    Publication Year: 1978, Page(s): 19
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  • Scanning the Institute

    Publication Year: 1978, Page(s):20 - 24
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  • Spectral lines: More power to you and more computer power, too

    Publication Year: 1978, Page(s): 25
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (445 KB)

    A careful study of the technical-interest profiles of IEEE's 180 000 members suggests that not quite 30 000 of them are linked directly and principally to the electric power industry ¿ yet all members have a vested interest in energy matters simply by being consumers of power. Thus, it is not surprising to find, over the past few years, that articles published in Spectrum on the topics of power an... View full abstract»

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  • Loch Ness revisited: Fact or fantasy? Science uses sonar and camera to probe the depths of Loch Ness in search of its resident monster

    Publication Year: 1978, Page(s):26 - 29
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (3061 KB)

    Underwater observations of moving targets in Scotland's Loch Ness, using sonar and photographic equipment, have heightened scientific speculation that the celebrated resident monster, `Nessie', may be more than a tall tale. After centuries of myths, hoaxes, and unsubstantiated claims, there seems to be some basis for the cautious change in attitude that is taking place within the scientific commun... View full abstract»

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  • Military: Electronic warfare: From RF to EO: Electrooptics gains on RF and acoustic technologies in electronic deception, jamming, and neutralization

    Publication Year: 1978, Page(s):30 - 38
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (11974 KB)

    Five basic actions are involved in the sequence of events taken to protect a `platform' (airplane, ship, or tank): pre-engagement collection of intelligence, also known as electronic warfare support measures; self-concealment; threat detection; processing of threat information; and response. The area of electrooptic warfare is used to illustrate these actions. View full abstract»

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  • Anatomy of a blackout: How's and why's of the series of events that led to the shutdown of New York's power in July 1977

    Publication Year: 1978, Page(s):39 - 49
    Cited by:  Papers (13)
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    Explains the series of events that led to the shutdown of New York's power in July 1977 during an intense electrical storm. View full abstract»

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  • Power/energy: EPRI looks inward, and ahead: The electric power research institute's senior staff, in a candid session, probes its programs and progress

    Publication Year: 1978, Page(s):48 - 53
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (3404 KB)

    The Electric Power Research Institute's senior staff convened at its Palo Alto headquarters to review progress and problems of the utility industry, with specific emphasis on its own programs. The four-hour conference yielded a 153-page transcript, a portion of which was published in the EPRI Journal for Jan./Feb. 1978. The present article represents selected highlights of the conference. View full abstract»

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  • Inventors: `Protect thyself': Careful attention to the claims section will go far toward establishing patent validity and extending the scope of protection

    Publication Year: 1978, Page(s):54 - 60
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (6093 KB)

    The single most important reason why so many electrical patents are of dubious value is that inventors fail to participate fully in the task of patent preparation. The vast majority of inventors carefully review drawings and descriptions before their patent applications are filed. But unfortunately, an almost equal proportion totally ignore the claims section (one-paragraph summaries of the invent... View full abstract»

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  • Electrotechnology in China

    Publication Year: 1978, Page(s):61 - 66
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (3999 KB)

    This article is a distillation of impressions reported by a group of IEEE members who visited communications, computer, power equipment, and integrated-circuit factories in the Chinese People's Republic. View full abstract»

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  • IEEE tables of contents for current and future publications

    Publication Year: 1978, Page(s):67 - 71
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  • Future special Issues

    Publication Year: 1978, Page(s): 71
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  • New and recent IEEE publications

    Publication Year: 1978, Page(s):72 - 73
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  • New product applications: Self-contained microprocessor chip contains 1024 bytes of ROM and 256 bits of RAM

    Publication Year: 1978, Page(s):74 - 79
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  • Spectrum's hardware review

    Publication Year: 1978, Page(s): 80
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (688 KB)

    For more information on the following products, circle numbers on the Reader Service Card corresponding to bracketed numbers. View full abstract»

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  • News from industry

    Publication Year: 1978, Page(s): 81
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  • News from region 1

    Publication Year: 1978, Page(s):82 - 82B
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  • Applications literature: Making measurements with piezoreslstive strain gages

    Publication Year: 1978, Page(s): 83
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (558 KB)

    This 20-page bulletin gives a detailed description of piezoresistance in semiconductors, strain-gage characteristics, and typical strain-gage measurement circuits. Definitions of piezoresistivity, gage factor, and doping start the presentation, followed by a discussion of gage characteristics. The circuitry section details bridge circuits, dynamic strain measurements, static strain measurements, g... View full abstract»

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  • Book reviews

    Publication Year: 1978, Page(s):84 - 85
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