# IEEE Transactions on Instrumentation and Measurement

## Filter Results

Displaying Results 1 - 25 of 38
• ### [Front cover]

Publication Year: 1971, Page(s): c1
| PDF (453 KB)
• ### IEEE Instrumentation and Measurement Group

Publication Year: 1971, Page(s): nil1
| PDF (128 KB)
• ### [Breaker page]

Publication Year: 1971, Page(s): nil1
| PDF (128 KB)

Publication Year: 1971, Page(s): 181
| PDF (142 KB)
• ### Preface

Publication Year: 1971, Page(s): 182
| PDF (141 KB)
• ### The Concept of a System Operating Surface'' as a Fundamental System Characteristic

Publication Year: 1971, Page(s):183 - 191
Cited by:  Papers (1)
| | PDF (1656 KB)

The development of the concept of an operating surface of a measuring system yields as deductively derived special cases, the unbalance, reference-balance, null-balance, unbalance comparison, differential, and directional measurement methods. These apparently unrelated measurement methods now appear as special cases of a new general concept, which is a powerful tool in system analysis and design. ... View full abstract»

• ### Automatic Test Systems Dedicated or Integrated

Publication Year: 1971, Page(s):191 - 198
Cited by:  Papers (1)
| | PDF (1862 KB)

An automatic test system is composed of parts that are basically refined versions of standard measurement and test instruments. The instruments used in the automatic test system must be automatically programmable to provide the stimulus or measurement range called for by the test program and they must be capable of receiving these programmed instructions from a computer or controller that serves a... View full abstract»

• ### A Fast Digital Spectral Analyzer

Publication Year: 1971, Page(s):198 - 201
Cited by:  Patents (2)
| | PDF (1394 KB)

This paper describes a processor that is being used for radar and multichannel sonar spectral analysis of band-limited input signals. Its design is based on a shift-register implementation of a fast Fourier transform algorithm coupled with a single flow-through arithmetic unit. In less than 12 ms, 4096 complex input data samples can be transformed, making it one of the faster systems in operation.... View full abstract»

• ### The System Approach to Signal Conditioning

Publication Year: 1971, Page(s):201 - 205
| | PDF (798 KB)

This paper describes a complete highly flexible signal conditioning system for matching transducers to readout devices. This system differs from conventional systems, in which a matching channel consists of separately packaged and powered components with interconnecting cables, in that all the components for a matching channel are packaged and powered together in one mainframe that provides the in... View full abstract»

• ### Interim Data Acquisition System for the Environmental Test Laboratory

Publication Year: 1971, Page(s):206 - 209
| | PDF (1258 KB)

An interim data acquisition (IDAC) system was developed and installed in the Environmental Test Laboratory of the Applied Physics Laboratory. This system can scan 200 analog voltages and 400 thermocouples under control of a programmable calculator. The calculator converts the data to engineering units, checks calibration channels for out-of-tolerance and thermocouples for open circuit. Source and ... View full abstract»

• ### RUDI: A Computer-Controlled Test-Data-Acquisition and Processing System

Publication Year: 1971, Page(s):209 - 217
Cited by:  Papers (1)
| | PDF (3929 KB)

A data-acquisition system built around a multiprogrammed SEL-810A digital computer is used by the RCA-Astro-Electronics Division (AED) Environmental Test Center, Princeton, N. J., for the acquisition and processing of quasi-static signals originating from a variety of analog transducers during spacecraft environmental simulation tests. The system gathers analog data with the aid of three mobile in... View full abstract»

• ### Digital Analyzer for Statistical Moments: Design and Error Characteristics

Publication Year: 1971, Page(s):218 - 225
Cited by:  Papers (4)
| | PDF (1917 KB)

A digital instrument is described that provides decimal readouts of the first four time-averaged moments and of the cumulative amplitude probability of a randomly varying voltage. There is no low-frequency limit, the upper-frequency being limited to about 6 kHz for a 99 percent confidence interval of 1 percent error. Measurements can be made in a one-cycle mode (for periodic inputs) or in a fixed-... View full abstract»

• ### Automatic Level Measuring System for Frequencies Between 200 Hz and 100 MHz

Publication Year: 1971, Page(s):225 - 230
Cited by:  Patents (1)
| | PDF (1772 KB)

An automatic level measuring system is described allowing selective voltage and voltage difference measurements with very high accuracy and high measuring speed in a frequency range of 200 Hz to 2 MHz or 10 kHz to 100 MHz. The system includes devices for measuring the reflection coefficient as well as multipoint scanners with low insertion loss and high crosstalk attenuation. All essential functio... View full abstract»

• ### Advances in Computer-Controlled Measurements of Cable Parameters

Publication Year: 1971, Page(s):231 - 234
| | PDF (1519 KB)

Since 1967, computer-controlled test systems have been used with great success for the rapid and automatic test and evaluation of parameters of multiconductor telephone cables ranging in lengths from 200 to 20 000 ft. These parameters are important in the design and manufacture of cables by determining transmission efficiency, crosstalk, and noise. These systems have evolved into a second-generati... View full abstract»

• ### Automated Testing of the SAS-A Experiment

Publication Year: 1971, Page(s):235 - 238
| | PDF (1496 KB)

The small astronomy satellite (SAS-A) was placed into earth orbit in December 1970 with one experiment designed to scan the celestial sphere for sources of X-ray emission. An automated test procedure was used to confirm proper operation of all the experiment sensors and electronics prior to launch of the spacecraft. The testing that had to be conducted over the operational spacecraft telemetry and... View full abstract»

• ### Circuit-Delay Test Instrument

Publication Year: 1971, Page(s):238 - 242
Cited by:  Patents (1)
| | PDF (2979 KB)

The evaluation of signal propagation delay in multiple-input multiple-output digital circuits can be very time consuming. For a circuit with n inputs there are 2n different input address states and 2n(2n - 1) different input address state transitions, each of which may result in a different propagation-delay time. A circuit-delay tester has been designed and built ... View full abstract»

• ### Program-Controlled Memory Test System

Publication Year: 1971, Page(s):242 - 249
| | PDF (2993 KB)

The test system provides facilities for determining the range of satisfactory operating parameters of a memory with high accuracy, in a short time, under program control. The system performs its overall control by a miniature computer; it makes memory write-and readout tests, judges the quality while changing various electrical conditions in the memory equipment, and displays the operating area wi... View full abstract»

• ### A Technique for Avoiding Connection Errors in Computerized Impedance-Measuring Systems

Publication Year: 1971, Page(s):249 - 253
| | PDF (933 KB)

The technique described uses a series of impedance measurements with different lead combinations and a calculation to determine the impedance of an unknown in the presence of lead and loading impedances. In general, a four-terminal ac or dc measurement requires four leads, four switches, and a series of five two-terminal measurements. However, an ac bridge is shown that requires only two switches ... View full abstract»

• ### An Integrated System for the Precise Calibration of Four-Terminal Standard Resistors

Publication Year: 1971, Page(s):253 - 257
Cited by:  Papers (1)
| | PDF (842 KB)

A description is given of the system currently in use at the National Bureau of Standards for measurements of 1-?? standard resistors of the Thomas type. A tenfold improvement in accuracy over the former method has been realized. Resistors of this type are now reported to eight decimal places with a total uncertainty of 0.08 ppm. The latter figure includes a three-standard-deviation limit for rand... View full abstract»

• ### A Compact High-Precision Guarded Volt Box

Publication Year: 1971, Page(s):257 - 265
| | PDF (3377 KB)

A new high-precision guarded volt box providing output voltages of 1.5 V for all input voltage ranges up to a maximum of 1500 V with ranges selected by a single rotary switch for tap changing is described. The design, test results, field experience, as well as the effects of voltage ratio errors, resistance value drift with time, self-heating errors, leakage errors, rod resistance, and temperature... View full abstract»

• ### Direct Measurement of DC Hysteresis Losses by Means of Digital and Sampling Techniques

Publication Year: 1971, Page(s):265 - 267
Cited by:  Papers (5)
| | PDF (593 KB)

The fundamental equation for evaluating the hysteresis losses Ph = ??? H dB, transformed for the use of electrical units and approximated as numeric integral Ph = W1/W2 2/1mA ???? -J ??+J J is sufficiently correct ???? is constant and very small. By continuously changing the magnetizing current in the primary winding w1 of Epstein frames or ri... View full abstract»

• ### A Digital Setup for Determining Magnetic AC Properties

Publication Year: 1971, Page(s):267 - 270
| | PDF (734 KB)

In order to determine the ac properties of laminated magnetic-core materials, a digital assembly has been developed to measure the mean half-period value nearly independent of frequency. Conventional integrating digital voltmeters are unsuitable for such measurements if the frequency fs of the unknown voltage does not fit the equation fs?? To = integer,'' where To View full abstract»

• ### EEMTIC Session, Wednesday, June 2, 1971

Publication Year: 1971, Page(s):271 - 284
| | PDF (3536 KB)

The EEMTIC meeting on Wednesday afternoon, June 2, 1971, was devoted to a discussion of standards, their nature, their creation, and the role they play in industry and commerce. The session consisted of five formal talks, which were presented following an introductory statement by the session chairman, Mr. Frank L. Hermach of the U.S. National Bureau of Standards. At the conclusion of the fifth pa... View full abstract»

• ### A Data System for High-Voltage DC Test Lines

Publication Year: 1971, Page(s):285 - 291
| | PDF (3146 KB)

An automatic data gathering and processing system for ??600-kV direct-current test lines at the National Research Council of Canada is described. The data consist of corona-loss current, radio interference, meteorological information, line voltage, and real time. The system consists of a 16-channel analog multiplexer, an A/D converter, a real-time clock, and a teletypewriter. All data are recorded... View full abstract»

• ### An Electronic Self-Balancing Instrument Transformer Testing Device

Publication Year: 1971, Page(s):291 - 296
Cited by:  Papers (7)
| | PDF (1036 KB)

A self-balancing instrument transformer testing device is described by which the voltage and current errors and phase displacements of instrument transformers can be read off or recorded directly with a printer or digital instrument. The circuitry correr sponds to the usual difference circuit in which the test transforme- is compared with a standard transformer. The voltage difference between the ... View full abstract»

## Aims & Scope

Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications.

Full Aims & Scope

Editor-in-Chief