IEEE Spectrum

Volume 8 Issue 6 • June 1971

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Displaying Results 1 - 25 of 36
  • [Front cover]

    Publication Year: 1971, Page(s): c1
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  • [Advertisement]

    Publication Year: 1971, Page(s): nil1
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  • [Breaker page]

    Publication Year: 1971, Page(s): nil2
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  • [Advertisement]

    Publication Year: 1971, Page(s): 1
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  • Table of contents

    Publication Year: 1971, Page(s):2 - 3
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  • The Institute of Electrical and Electronics Engineers, Inc.

    Publication Year: 1971, Page(s): 4
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  • [Breaker page]

    Publication Year: 1971, Page(s): 4
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  • Inside IEEE

    Publication Year: 1971, Page(s):5 - 9
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  • Forum

    Publication Year: 1971, Page(s): 10
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  • News from Washington

    Publication Year: 1971, Page(s):11 - 12
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  • Spectral lines

    Publication Year: 1971, Page(s): 13
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  • Ecap IIߞAn electronic circuit analysis program

    Publication Year: 1971, Page(s):14 - 25
    Cited by:  Papers (9)
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (6452 KB)

    Ecap II, a nonlinear dc and transient circuit analysis program, uses a free-format, problem-oriented language for describing circuit parameters and topology. Its computation speed is high enough to make the transient analysis of kilobranch nonlinear circuits feasible. The program includes a nested model feature that permits the user to store circuit descriptions of devices and subcircuits for subs... View full abstract»

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  • Switching in vacuum. a review

    Publication Year: 1971, Page(s):26 - 37
    Cited by:  Papers (13)
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (9867 KB)

    The growing use of vacuum interruption devices by the power and control industries in the past decade has introduced these mechanisms to many people to whom the area of vacuum switching is somewhat new. It is felt that a review of vacuum switching from a historical and technological standpoint will facilitate a more general understanding of this important subject. View full abstract»

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  • Digital and analog signal applications of operational amplifiers II-Sample/hold modules, peak detectors, and comparators

    Publication Year: 1971, Page(s):38 - 46
    Cited by:  Patents (4)
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (4753 KB)

    There are two basic types of sample/hold circuits- inverting and noninverting-and two important parameters for these circuits-aperture time and acquisition time. Peak detectors are special forms of sample/hold modules in which the peak value of an input signal, once reached, is automatically held. The last networks discussed in this article are comparators, in which one or more summing resistors a... View full abstract»

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  • [Advertisement]

    Publication Year: 1971, Page(s):47 - 50
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  • Electrical safety in industrial plants

    Publication Year: 1971, Page(s):51 - 55
    Cited by:  Papers (24)
    Request permission for reuse | Click to expandAbstract | PDF file iconPDF (2665 KB)

    Most electrical engineers and electricians are aware that the principal danger from electricity is that of electrocution, but few really understand just how minute a quantity of electric energy is required for electrocution. Actually, the current drawn by a 7½-watt 120-volt lamp, passed from hand to hand or foot, is enough to cause fatal electrocution. Just as it is curent. and not voltage, that h... View full abstract»

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  • IEEE Reports for 1970

    Publication Year: 1971, Page(s):56 - 68
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  • New product applications

    Publication Year: 1971, Page(s):69 - 74
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  • Scanning the issues

    Publication Year: 1971, Page(s):75 - 76
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  • Advance tables of contents

    Publication Year: 1971, Page(s):77 - 79
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  • Special publications

    Publication Year: 1971, Page(s): 80
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  • Future special issues

    Publication Year: 1971, Page(s): 81
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  • Book reviews

    Publication Year: 1971, Page(s):82 - 83
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  • [Advertisement]

    Publication Year: 1971, Page(s): 83
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  • Focal points

    Publication Year: 1971, Page(s):84 - 86
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IEEE Spectrum Magazine, the flagship publication of the IEEE, explores the development, applications and implications of new technologies.

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