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Manufacturing Technology, IEEE Transactions on

Issue 1 • Date March 1976

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Displaying Results 1 - 8 of 8
  • Guest Editor's Introduction

    Publication Year: 1976 , Page(s): 1
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    Freely Available from IEEE
  • Fault Isolation Technique Cuts Testing Costs

    Publication Year: 1976 , Page(s): 2 - 8
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  • Screening program effectiveness

    Publication Year: 1976 , Page(s): 9 - 13
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    During the last ten to fifteen years, active and passive device screening has received considerable discussion. The literature contains well over 100 papers dealing with various aspects of part screening and the cost effectiveness of such programs. Although these reports are generally favorable toward the decision to utilize some type of 100-percent testing beyond the manufacturers normal end-of-l... View full abstract»

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  • How and Where Do We Grow the Process and Manufacturing Technologist of the Future? (A Trend-A Need-A Partial Answer!)

    Publication Year: 1976 , Page(s): 29 - 32
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  • Test Data Reduction

    Publication Year: 1976 , Page(s): 24 - 29
    Cited by:  Papers (2)
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    The general problem of reducing data available in the integrated circuit environment is addressed. One can consider the circuit to be essentially composed of identification and performance data. Opportunities exist at every level of manufacturing and testing to aid in the final interpretation of the results. Without disturbing the technology or actual circuit design, some general methods for impro... View full abstract»

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  • Can a User Test LSI Microprocessors Effectively?

    Publication Year: 1976 , Page(s): 21 - 23
    Cited by:  Papers (1)
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    This paper elucidates user oriented test philosophy for LSI microprocessors. Also, a low-cost incoming inspection tester is described. The significant difference between this and available testers is the use of probabilistic scheme by which the instruction, data, and control signal mixes are generated. This approach reduced significantly tester hardware and supporting software without compromise o... View full abstract»

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  • Test Techniques

    Publication Year: 1976 , Page(s): 17 - 21
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    The test operation is normally limited to the smallest number of tests that effectively measure the ability of the device to meet or exceed a set of reliability and performance criteria. Diagnostic testing, on the other hand, attempts to characterize the device in order to identify fault mechanisms to provide feedback for yield and/or performance improvement. Utilization of the capabilities of com... View full abstract»

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  • Financial Consciousness in the Manufacturing of Thin-Film Hybrids

    Publication Year: 1976 , Page(s): 13 - 17
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    As electronic components become smaller, quality and cost control problems within a manufacturing operation become correspondingly larger. This happens because there is a direct relationship between shrinking component size and shrinking yields. As yields become lower, they also become more erratic, which phenomena, in turn, makes it very difficult to control production costs and provide pricing g... View full abstract»

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Aims & Scope

This Transaction ceased production in 1977. The current publication is titled IEEE Transactions on Components, Packaging, and Manufacturing Technology.

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