IEEE Transactions on Circuits and Systems

Volume 26 Issue 7 • July 1979

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Displaying Results 1 - 23 of 23
  • Editorial

    Publication Year: 1979, Page(s):409 - 410
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    Freely Available from IEEE
  • Automatic test generation techniques for analog circuits and systems: A review

    Publication Year: 1979, Page(s):411 - 440
    Cited by:  Papers (81)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (4241 KB)

    The purpose of this paper is both a review and an assessment of techniques presently available for automatic test generation for analog systems. After recalling the general problems of automatic testing (definitions, faults in analog systems, different types of tests, main operations, and diagnosis procedures), characterization and description modes of analog systems, and the main software ingredi... View full abstract»

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  • Generation of software for computer controlled test equipment for testing analog circuits

    Publication Year: 1979, Page(s):537 - 548
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1584 KB)

    The NOPAL system automatically generates programs in the ATLAS test programming language to test and diagnose malfunctions in analog electronic circuit boards. The system consists of two parts: a top part which analyzes the circuit diagram and determines the necessary tests, and a bottom part which analyzes the required tests and produces a program in the RCA EQUATE ATLAS test language for use wit... View full abstract»

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  • Calculation of parameter values from node voltage measurements

    Publication Year: 1979, Page(s):466 - 474
    Cited by:  Papers (39)  |  Patents (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (928 KB)

    In this paper a theorem is given for the necessary and sufficient test conditions required to determine the value of a circuit component from node voltage measurements at a single test frequency. Several techniques are then presented for the calculation of circuit component values from voltage measurements, including a new technique based on the adjoint circuit concept. In addition, some results a... View full abstract»

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  • Fault isolation algorithm for analog electronic systems using the fuzzy concept

    Publication Year: 1979, Page(s):518 - 522
    Cited by:  Papers (11)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (528 KB)

    We are mainly concerned with enhancing ATPG for analog nonlinear circuits. For simplicity we are dealing only with the isolation of single fault cases. Due to the imprecision and indeterminacy of the complex structure of faulty networks, it is usually difficult to obtain exact solutions. Furthermore, for fault isolation it is often unnecessary to seek the exact solutions. In fact we find it useful... View full abstract»

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  • Fault diagnosis for linear systems via multifrequency measurements

    Publication Year: 1979, Page(s):457 - 465
    Cited by:  Papers (83)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1040 KB)

    The fault diagnosis problem for a linear system whose transfer function matrix is measured at a discrete set of frequencies is formalized. A measure of solvability for the resultant equations and a measure of testability for the unit under test is developed. These, in turn, are used as the basis of algorithms for choosing test points and test frequencies. View full abstract»

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  • A pragmatic approach to automatic test generation and failure isolation of analog systems

    Publication Year: 1979, Page(s):584 - 585
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (304 KB)

    Digital automatic test generation has been successful due to simplified modeling at the logic gate or higher level, rather than the component level, and to logic simulation performed for the stuck-at failure mode only. Analog automatic test generation generally requires modeling and simulation at the component level and continuous failure modes over a certain range of parameter values. As a result... View full abstract»

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  • Diagnosability of linear active networks

    Publication Year: 1979, Page(s):485 - 489
    Cited by:  Papers (10)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (616 KB)

    The problem of diagnosis studied here is to determine the currents and/or voltages of desired elements from the measured currents and/or voltages of certain other elements. A necessary and sufficient condition for diagnosablity is given in connection with the structure of 2-graphs. The relationship between the structure and the electrical connectivity is presented to show the diagnosability depend... View full abstract»

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  • Simplified ATPG and analog fault location via a clustering and separability technique

    Publication Year: 1979, Page(s):496 - 505
    Cited by:  Papers (20)  |  Patents (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1224 KB)

    Automatic test program generation (ATPG) for analog system fault location is considered and a procedure for generating a set of tests for a linear network using gain and phase measurements from input-output measurements only is presented. The best subset of features for fault diagnosis is selected via a discriminatory index. Each feature subset selected during the optimization procedure is tested ... View full abstract»

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  • Fault dictionary based upon stimulus design

    Publication Year: 1979, Page(s):529 - 537
    Cited by:  Papers (29)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1096 KB)

    A method of fault signature generation is presented that is based upon state space analysis of linear circults. An input control sequence is designed to reduce a nontrivial initial state of the circuit under test to the zero state in finite time. The realization of this stimulus as a piecewise constant waveform has step amplitudes that are exponential functions of the poles of the circuit under te... View full abstract»

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  • The application of statistical simulation to automated analog test development

    Publication Year: 1979, Page(s):513 - 517
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (632 KB)

    The CAPITOL circuit simulation program provides algorithms for selecting tests and formulating test limits for linear and nonlinear analog circuits subject to random deviations from nominal component values. These analog test development algorithms are implemented as part of the Monte Carlo statistical simulation capability of the program. The algorithms are based on fundamental principles of stat... View full abstract»

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  • A theory and an algorithm for analog circuit fault diagnosis

    Publication Year: 1979, Page(s):440 - 457
    Cited by:  Papers (46)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1912 KB)

    A theory for the study of the analog circuit fault diagnosis problem is developed. Sufficient conditions are presented such that the value of each of the network elements is uniquely determinable from the network's behavior as seen from its external terminals. It is shown how one can determine-considering only the circuit's topology-whether or not it is possible to compute the element values of a ... View full abstract»

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  • Systematic fault simulation in an analog circuit simulator

    Publication Year: 1979, Page(s):549 - 554
    Cited by:  Papers (7)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (776 KB)

    With the recent increase in both fault isolation and fault tolerant design, automated and systematic methods of analyzing fault situations and their impact on the operation of solid-state circuitry are becoming increasingly important. In this paper we will explore the philosophy and techniques behind the design of a system for simulating various catastrophic failures in integrated circuits which i... View full abstract»

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  • Efficient fault analysis in linear analog circuits

    Publication Year: 1979, Page(s):475 - 484
    Cited by:  Papers (18)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1112 KB)

    Fault analysis in analog networks is a form of network parameter identification. The problem of finding network parameters from measurements at the accessible terminals can be expressed as the solution of a system of nonlinear equations. Such a system of equations is usually solved by a multidimensional search. Every step of the search requires solving for the network responses in terms of the par... View full abstract»

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  • Fault location in a noisy multiple-nonlinearity servosystem

    Publication Year: 1979, Page(s):586 - 589
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (496 KB)

    In certain applications it is desirable to isolate faults in a nonlinear system using dynamic measurements at a limited number of access points. This can be achieved by stimulating the system with a serial mode sinusoidal signal and using the fundamental and higher harmonic responses at the access points to form the system "signature." The fault signature is then compared with a restricted number ... View full abstract»

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  • Sequentially linear fault diagnosis: Part I-Theory

    Publication Year: 1979, Page(s):490 - 496
    Cited by:  Papers (10)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (760 KB)

    A good solution to the tradeoff problem between the cost of the computation and the cost of test points is the sequentially linearly diagnosable systems. Conditions under which a system is sequentially linearly diagnosable are developed in Part I. A design procedure for the test points to fulfill these conditions is given in Part II. View full abstract»

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  • A dc approach for analog fault dictionary determination

    Publication Year: 1979, Page(s):523 - 529
    Cited by:  Papers (104)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (904 KB)

    Efficient solution of dc node voltages for nonlinear analog electronic circuits has been demonstrated by computer-aided circuit analysis programs such as SYSCAP II [1] (System of Circuit Analysis programs) for the nominal case and for inserted faults. In addition dc node voltage postprocessing techniques [2] have been developed to determine required input stimuli and the minimum number of test poi... View full abstract»

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  • Optimum fault isolation by statistical inference

    Publication Year: 1979, Page(s):505 - 512
    Cited by:  Papers (8)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1040 KB)

    Fault Isolation is always based on a statistical model of fault occurrence and measurement error. Usually the statistical assumptions are impilcit and unstated. Making them explicit and systematically exploring their consequences proves to be an extremely powerful method of developing optimum fault isolation techniques. A criterion is developed here for optimum isolation of catastrophic faults. Th... View full abstract»

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  • On the use of procedural models for generation of test programs

    Publication Year: 1979, Page(s):555 - 557
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (440 KB)

    An approach based on artificial intelligence concepts is developed for automatic generation of test programs for analog circuits. The programs will, with the help of automatic test equipment (ATE), make appropriate measurements and deduce the location of potential faults in analog circuit boards. View full abstract»

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  • A search algorithm for the solution of the multifrequency fault diagnosis equations

    Publication Year: 1979, Page(s):589 - 594
    Cited by:  Papers (27)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (720 KB)

    A search algorithm for the solution of the fault diagnosis equations arising in linear time invariant analog circuits and systems is presented. By exploitation of Householder's formula an efficient algorithm whose computational complexity is a function of the number of system failures rather than the number of system components is obtained. View full abstract»

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  • Sequentially linear fault diagnosis: Part II-The design of diagnosable systems

    Publication Year: 1979, Page(s):558 - 564
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (760 KB)

    Based on the results developed in Part I a strategy of test point location by which the parameters of an LSDS are made diagnosable in a generic sense, is developed. By appropriate test point placement, an LSDS is reduced to a canonical LSDS. Next, an algorithm for the synthesis of the test points required to make the parameters of the canonical LSDS sequentially linearly diagnosable in a generic s... View full abstract»

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  • Design of a suboptimal Kalman filter of very high reliability and speed, with internal reconfiguration and failure localization

    Publication Year: 1979, Page(s):565 - 574
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (952 KB)

    A suboptimal analog or hybrid Kalman filter implementation is described, stressing reliability, robustness, and speed requirements. The filter is assumed to have mismatched dynamics, noise, and drift, but also computational errors. The state estimation error propagation is studied, and time-dependent bounds established to determine the reinitialization rate. Three alternate filter architectures ar... View full abstract»

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  • On-line fault diagnosis of switching networks

    Publication Year: 1979, Page(s):575 - 583
    Cited by:  Papers (10)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (888 KB)

    A mathematical model of the switching network is described. Three fault-diagnostic methods, based on the use of on-line data, are presented along with associated theoretical statistics. The results are given of simulations substantiating the validity of the model and the theoretical statistics. View full abstract»

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