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Proceedings, IEEE AUTOTESTCON

17-17 Oct. 2002

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Displaying Results 1 - 25 of 84
  • 2002 IEEE AUTOTESTCON Proceedings. Systems Readiness Technology Conference. 'The New Millennium Challenge - Transforming Test' (Cat. No.02CH37350)

    Publication Year: 2002
    Request permission for commercial reuse | PDF file iconPDF (366 KB)
    Freely Available from IEEE
  • Author index

    Publication Year: 2002, Page(s):xxii - xxiii
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    Freely Available from IEEE
  • UUT test requirements capture in any language you like... and still compliant with the IEEE Signal definition and test description standard

    Publication Year: 2002, Page(s):411 - 433
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (1011 KB) | HTML iconHTML

    This paper examines how to create consistent, portable, usable UUT requirement specifications utilizing COTS computer languages such as Basic, Java, C or C++. It goes on to describe the benefits of using standard, common building blocks that represent signals, and identifies the importance of allowing users to extend their own signal components. It concludes by showing several examples of the same... View full abstract»

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  • Overview and applications of the IEEE P1451.4 smart sensor interface standard

    Publication Year: 2002, Page(s):777 - 786
    Cited by:  Papers (2)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (454 KB) | HTML iconHTML

    With the goal of promoting the development and adoption of smart transducers, the IEEE 1451 family of smart sensor interface standards defines a set of standardized interfaces for different categories of smart sensors and smart actuators. One member of this family, the IEEE P1451.4 standard, defines a mixed-mode interface that combines that traditional analog sensor signal with a digital interface... View full abstract»

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  • Implementation of Prognostics Framework on Navy Battle Group - Automated Maintenance Environment (BG-AME) and Total Ship Monitoring (TSM) Programs

    Publication Year: 2002, Page(s):788 - 800
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (642 KB) | HTML iconHTML

    This paper will describe how the Prognostics Framework model-based reasoning tool was used by the Navy under the Battle Group - Automated Maintenance Environment (BG-AME) and Total Ship Monitoring (TSM) Programs to provide real-time condition monitoring and prognostics of ship systems, and provide mission capability assessments to commanders. View full abstract»

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  • IVI comes of age: an overview of IVI specifications with current status

    Publication Year: 2002, Page(s):317 - 323
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (368 KB) | HTML iconHTML

    IVI stands for Interchangeable Virtual Instruments. The IVI Foundation was formed in 1997 and is a consortium founded to promote standard specifications for programmable test instruments The IVI Foundation focuses on the needs of users who build high performance test systems. By building on existing industry standards such as VXIplug&play driver concepts, the Foundation's goal is to deliver specif... View full abstract»

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  • Programmable real time bus emulation with real time data update

    Publication Year: 2002, Page(s):82 - 92
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (606 KB) | HTML iconHTML

    To meet the bus emulation requirements for digital avionics many Automatic Test Equipment (ATE) and/or Test Program Set (TPS) suppliers must design peculiar hardware in test stations or Interface Test Adapters (ITAs) to meet real time bus emulator requirements. Recently, BAE SYSTEMS Mission Solutions completed a rehost of the Central Electronics Unit (CEU) Line Replaceable Unit (LRU) TPS for the L... View full abstract»

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  • Test station configuration and health management

    Publication Year: 2002, Page(s):2 - 10
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (653 KB) | HTML iconHTML

    This paper discusses how the test station health and care play an important part in minimizing no fault found (NFF) cases on units under test (UUTs). The paper presents successfully tested methods to collect and analyze test results, and display test information for test station instruments, interface test adapters (ITAs), and UUTs. The technology is currently being prototyped for the Ogden F-16 a... View full abstract»

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  • Synthesis of complex signals on test equipment

    Publication Year: 2002, Page(s):394 - 410
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (769 KB) | HTML iconHTML

    A traditional signal definition exhaustively lists every attribute and condition that it was thought the signal could possibly have. However, it is often the case that we are only interested in controlling a limited number of signal attributes and conditions. The traditional method is inflexible in this respect, leading to problems when trying to map different capabilities in a signal standard, as... View full abstract»

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  • Enveloping test requirements across product life cycle phases

    Publication Year: 2002, Page(s):306 - 315
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (560 KB) | HTML iconHTML

    With the total cost of test increasing over the life cycle of a product, there is an urgent need to "reduce the cost of test". This concept does not just address the high cost of test equipment, but rather looks at all aspects of test from requirements generation, to development, production, and post-production support at a depot or in the field. These aspects must be integrated together using a s... View full abstract»

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  • Extending your test without extending your test system

    Publication Year: 2002, Page(s):42 - 47
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (345 KB) | HTML iconHTML

    Often a test system developer discovers that there is a need for just a bit more capability than the original specifications called for. This paper looks at ways of pulling out that little bit extra, using the spare, but less obvious capabilities that are built into all systems. View full abstract»

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  • RF Measurement Synthetic Instrumentation - 26.5 GHz and beyond

    Publication Year: 2002, Page(s):74 - 81
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (490 KB) | HTML iconHTML

    Synthetic Instrumentation is a class of test devices implemented primarily with software and supported with minimal hardware conditioning for the test signals. This philosophy permits frequent reuse of the hardware elements (processors, A/Ds, D/As, signal conditioners and switches) when commanding different instrument functions. Substantially lower purchase and life cycle costs are therefore achie... View full abstract»

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  • Concurrent test systems using the structured distributed-programming paradigm

    Publication Year: 2002, Page(s):152 - 163
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (515 KB) | HTML iconHTML

    Traditionally developers in the automatic testing community have had no viable paradigm for handling concurrent systems. Test suites that could be processed in one hour using concurrency are being processed in 24 hours sequentially. The structured distributed programming paradigm (SDPP) is a non-traditional paradigm that allows developers to conceive viable distributed/concurrent/parallel systems ... View full abstract»

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  • Nanotechnology impact on aircraft design and maintenance

    Publication Year: 2002, Page(s):769 - 776
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (630 KB) | HTML iconHTML

    This paper describes unique research efforts relating to the development of nanoscale devices to replace standard integrated circuits, and eventually entire electronic systems. Standard integrated circuits (IC) have limitations or restrictions in size, speed, reliability, complexity and finding suitable replacements for discontinued items. Nanoscale device development and understanding has dramati... View full abstract»

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  • Signal definition and test description - an IEEE standard

    Publication Year: 2002, Page(s):380 - 393
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (484 KB) | HTML iconHTML

    This paper presents a summary of the new Signal Definition and Test Description Standard (SDTD) to be published by the IEEE. SDTD represents a radical departure from previous approaches to test description, in that it no longer simply represents a test language, as typified by ATLAS standards such as IEEE Std. 716 1995. Instead it provides a framework for component libraries of signal descriptions... View full abstract»

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  • Development of an automatic test set for an air-to-ground weapon system

    Publication Year: 2002, Page(s):296 - 305
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (544 KB) | HTML iconHTML

    This paper discusses the design and development of the Services Weapon Test Set (SWTS); an automated test set that is designed to be used at the Second Line Maintenance Facility for the troubleshooting and certification of the Brimstone Weapon System. This test set is designed to be operated by Royal Air Force personnel with little or no system unique training, and without the use of Technical Pub... View full abstract»

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  • Evaluation of economics of testing in a manufacturing environment

    Publication Year: 2002, Page(s):481 - 489
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (387 KB) | HTML iconHTML

    In the manufacture of complex electro-mechanical devices, testing operations are instituted at many points in the process. The primary purpose of these test operations is to ensure a minimum number of faulty products propagate to the next level of assembly and that the corresponding test yield at that level of assembly is sufficient. The recurring and non-recurring expense of each of these test op... View full abstract»

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  • Streamlining customer vendor synergy through distributed test and automated issue reporting by utilizing modern test equipment connectivity and Internet infrastructure

    Publication Year: 2002, Page(s):895 - 911
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (844 KB) | HTML iconHTML

    The Internet is enabling a new approach to testing strategies by redistributing traditional test functions between component vendors and equipment integrators. Modern connectivity, design software and graphical programming environments have made it practical to create automated test programs that share information via the Internet. Many tests need no longer be preformed by the system integrator, b... View full abstract»

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  • Test strategy planning method for complex integrated circuits

    Publication Year: 2002, Page(s):640 - 649
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (521 KB) | HTML iconHTML

    This paper describes an advanced test planning technique for integrated circuits (ICs) with high production volumes. Since the proportion of test costs is relatively high, with complexities of IC devices increasing, many different test methods must be taken into account to test an IC cheaply and accurately. Many test planning methods have been introduced in the past ten years or more, however, the... View full abstract»

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  • A unified interface for signal-oriented control of instruments and switches

    Publication Year: 2002, Page(s):337 - 350
    Cited by:  Papers (10)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (591 KB) | HTML iconHTML

    The signal-based testing paradigm, which reduces the impact of instrument obsolescence, is typically implemented via software architectures that encapsulate instrument-specific code in signal drivers. The paper describes the design of a signal driver interface and an extension of this design that enables the uniform treatment of instruments and switches. The unified interface supports the control ... View full abstract»

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  • Leveraging LRU TPS diagnostic data for use in SRU TPS development

    Publication Year: 2002, Page(s):30 - 41
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (611 KB) | HTML iconHTML

    This paper explores how a model-based diagnostic reasoning tool and run time engine can be used during line replaceable unit (LRU) test program set (TPS) development to diagnose to the sub-shop replaceable unit (SRU) level and how the LRU diagnostic session file can be leveraged during SRU TPS development. This multi-tiered diagnostics approach is enabled by the Diagnostic Profiler tool, used to e... View full abstract»

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  • Flexible digital demodulation/integrating simulation software with measurement hardware

    Publication Year: 2002, Page(s):58 - 73
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (998 KB) | HTML iconHTML

    Digitally modulated signals are now an important part of most modern RF/microwave communications systems. Analysis and troubleshooting of digitally modulated signals in the presence of high frequency effects typically require specialized hardware and firmware/software. In the past decade, the commercial wireless industry has evolved with a number of standards specifications and a rich set of digit... View full abstract»

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  • Test Markup Language (TML)

    Publication Year: 2002, Page(s):585 - 596
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (506 KB) | HTML iconHTML

    This paper will briefly cover the Test Markup Language (TML) currently under development at The Boeing Company. TML is built on the commercial eXtensible Markup Language (XML) specification. View full abstract»

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  • Optical switching for automated test systems

    Publication Year: 2002, Page(s):140 - 151
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (616 KB) | HTML iconHTML

    The proliferation of optical technology in the commercial telecom arena has driven the need to develop cost effective fiber optic component test systems with high throughput rates. As more and more optical technology makes its way into military systems the needs are increasing for general-purpose optical test systems to meet these diverse requirements as well. An understanding of the optical perfo... View full abstract»

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  • Optimizing automated testing for high throughput

    Publication Year: 2002, Page(s):134 - 139
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (352 KB) | HTML iconHTML

    Throughput in automated testing is a critical issue, especially at the maintenance level. Some general rules and approaches, when used with an analysis of the total test requirement, can often substantially reduce test time. New programming environments and new (to test equipment) interface standards such as Ethernet, when available, may provide significant throughput improvement in a test system.... View full abstract»

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