IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record.

25-28 Sept. 1989

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  • AUTOTESTCON '89 Conference Record: 'The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century' (Cat. No.89CH2568-4)

    Publication Year: 1989
    Request permission for commercial reuse | PDF file iconPDF (70 KB)
    Freely Available from IEEE
  • A standardized instrument programming language based on IEEE STD 488.2

    Publication Year: 1989, Page(s):335 - 339
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (492 KB)

    The author describes the features of the Test and Measurement System Language (TMSL) and how they relate to compatibility. TMSL implements a tree-structured command set, rather than a traditional flat instrument language, allowing keywords to be reusable and identifiable in context. Reusable keywords allow for simple and regular mnemonic generation rules. TMSL has also addressed parameters through... View full abstract»

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  • A digital maintenance information (DMI) system for ATE

    Publication Year: 1989, Page(s):272 - 276
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (256 KB)

    The proposed DMI system provides a paperless information system in a personal computer (PC) environment and aids the service technician with synchronized video and graphic demonstrations. The user's need for a generic DMI system is considered, and a pilot program is discussed for the evaluation of a DMI system. It is concluded that the DMI system will cut the time, cost, and volume of paper now as... View full abstract»

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  • Fault tolerant engineering methodology and the impact on ATE

    Publication Year: 1989, Page(s):113 - 117
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (336 KB)

    Many new weapon systems are required to provide fault tolerance in order to achieve better overall reliability and weapon system effectiveness. A structured systems approach is required to implement efficiently the different forms of fault tolerance and reconfiguration in order to achieve a cost- and mission-effective fault-tolerant system, one that will meet the fault-tolerant requirements as wel... View full abstract»

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  • Automated application software generator

    Publication Year: 1989, Page(s):175 - 180
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (316 KB)

    It is noted that the development of test programs used with automatic test systems is highly complex and labor-intensive, requiring a high level of engineering training and skill. An automated software tool has been developed to automate these tasks. A workstation system has been developed that interactively aids the application test programmer in composing a test program, using techniques of arti... View full abstract»

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  • BIT and testability for millimeter wave systems

    Publication Year: 1989, Page(s):249 - 254
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (544 KB)

    The authors provide a basis for understanding BIT related and MMW (millimeter wave) system attributes which offer potential for transportability of current RF/microwave BIT concepts. A comparison of MMW and microwave technology provides a basis for identifying areas where there may be opportunity for the transfer of microwave BIT technology and testability techniques to MMW as well as areas where ... View full abstract»

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  • A software architecture for VXIbus systems

    Publication Year: 1989, Page(s):327 - 334
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (540 KB)

    The VXIbus standard defines the basic hardware and communications protocols for instrument-on-a-card systems. One important systems architecture that builds on VXI is based on local area network, UNIX-related technologies and an object-oriented software bus. The heart of the system is an embedded VXIbus processor for controlling the test system and implementing virtual instruments. The software bu... View full abstract»

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  • Two-level maintenance concept for advanced avionics architectures

    Publication Year: 1989, Page(s):75 - 79
    Cited by:  Papers (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (296 KB)

    The advanced avionic architecture for next-generation military aircraft will feature common signal- and data-processing modules. The common modules will incorporate VHSIC technology and feature extensive built-in-test (BIT) and error logging capabilities. These new technologies present an opportunity to eliminate the intermediate level of maintenance because self-diagnosed modules can be routed di... View full abstract»

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  • VHSIC phase 2 test requirements for the depot

    Publication Year: 1989, Page(s):289 - 295
    Cited by:  Papers (1)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (452 KB)

    The recently released Phase 2 very high speed integrated circuits (VHSIC) standards show that VHSIC will operate up to 100 MHz. The author examines the ATE (automatic test equipment) test capability that will be required for these high-performance digital circuits and whether new ATE capability will be required or whether present technology will be sufficient. His analysis shows that using the VHS... View full abstract»

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  • System level BIT: a tool for MATE test station self maintenance

    Publication Year: 1989, Page(s):267 - 271
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (300 KB)

    The author examines what can be done in a MATE environment to reduce self-test runtime and at the same time provide increased fault detection and isolation. His solution involves the integration of VMEbus extension for instrumentation (VXI bus) technology and existing BIT (built-in-test) techniques. This integration produces a system-level BIT capable of utilizing integrated test station resources... View full abstract»

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  • Use of application specific integrated circuits in developing downsized instrumentation

    Publication Year: 1989, Page(s):108 - 112
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (296 KB)

    Application-specific integrated circuits (ASICs) have been used to dramatically reduce the size, weight, and power consumption of instrumentation. The authors present methods used in implementing ASICs for analog and digital built-in tests. Techniques to reduce or eliminate switching requirements and to supply clocking and synchronization functions for downsized test applications are shown. Packag... View full abstract»

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  • Testability: the state of the art-automatic testing in the next decade and the 21st century

    Publication Year: 1989, Page(s):168 - 174
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (596 KB)

    The use of MIL-STD-2165 is a requirement on all new DoD weapon systems contracts. The authors discuss the major highlights of implementing a design-for-testability program, with particular attention paid to the 200 Series tasks for shop replacement assemblies, and describe the standard's effects on actual weapon systems designs. They outline specific approaches that can be used by the weapon syste... View full abstract»

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  • Optical system spectral transmission measurements in the visible and infrared

    Publication Year: 1989, Page(s):242 - 248
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (348 KB)

    A commercial system designed for measuring detector spectral response was modified for automated testing of optical systems and subassemblies. The modified system provides test capability for large and complicated optics that are not supported by commercially available transmission test systems that test only witness samples or small optical assemblies. The modifications to the commercial hardware... View full abstract»

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  • Reasoning from uncertain data: a bit enhancement

    Publication Year: 1989, Page(s):146 - 149
    Cited by:  Papers (1)  |  Patents (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (228 KB)

    It is proposed that artificial intelligence (AI) principles, coupled with powerful Bayesian statistical inference techniques, can be successfully applied to built-in-test (BIT) technology and can significantly contribute to the improvement of avionics BIT diagnostic capabilities. The goal is to extract more information from available data provided by the BIT, rather than to expand its testing capa... View full abstract»

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  • Now we have ATE: who's going to maintain it?

    Publication Year: 1989, Page(s):323 - 326
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (344 KB)

    The authors discuss original equipment manufacturer maintenance and self-maintenance with emphasis on hardware maintenance of in-circuit ATE (automatic test equipment). Issues such as software and fixture maintenance are also addressed. Maintenance is analyzed from an economics standpoint, and issues of jeopardy and practicality are discussed View full abstract»

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  • Smart built-in-test (BIT): an overview

    Publication Year: 1989, Page(s):67 - 74
    Cited by:  Papers (6)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (424 KB)

    The author reviews the smart BIT (built-in-test) efforts that Grumman has conducted for RADC (Rome Air Development Center). Their goal has been the elimination of false alarms by adding AI (artificial intelligence) to BIT to accomplish smart BIT. RADC has sponsored several efforts under the smart BIT heading whose emphases have been to improve the ability of BIT to make more robust decisions based... View full abstract»

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  • ATE self test

    Publication Year: 1989, Page(s):284 - 288
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (448 KB)

    The ability of automatic test equipment (ATE) to introspectively assess its own well-being as well as assess the well-being of the UUTs (units under test) external to itself has long been understood to be a major advantage of offline ATE. The author argues that this inherent potential ATE system capability has not been used effectively. It has been treated as an afterthought and implemented by the... View full abstract»

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  • Intelligent built-in test and stress management

    Publication Year: 1989, Page(s):261 - 266
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (440 KB)

    The authors describe two areas of technology, time stress measurement devices (TSMDs) and smart built-in test (smart BIT), which offer a combined approach to meeting future BIT needs. With reference to TSMD, one or more microelectronic packages are being developed with the capability of providing programmable and environmental stress measurement and recording. Smart BIT is an enhancement to tradit... View full abstract»

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  • Logistics impacts and influences of ATE designed to meet the TLM concept

    Publication Year: 1989, Page(s):32 - 36
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (392 KB)

    The two-level maintenance (TLM) concept is being advocated as a means of increasing support capability and reducing the total cost of system maintenance. Traditionally, the Air Force has used a three level maintenance concept, with a heavy emphasis on base level, in-shop repair. In the 1970s and 1980s, this approach to maintenance and the expanding technology of automated test systems resulted in ... View full abstract»

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  • An investigation of neural networks for F-16 fault diagnosis. I. System description

    Publication Year: 1989, Page(s):351 - 357
    Cited by:  Papers (4)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (496 KB)

    The authors report results of ongoing research exploring the use of artificial neural networks (ANNs) for F-16 flight line diagnostics. ANNs hold the promise of solving difficult logistics problems such as multiple fault diagnosis, prognostication, changing configurations and environments, and inaccurate diagnosis attributable to incomplete and/or flawed rules. The authors tested three representat... View full abstract»

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  • From a sow's ear-quantitative diagnostic design requirements from anecdotal references

    Publication Year: 1989, Page(s):195 - 200
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (340 KB)

    The diagnostic performance of modern avionic systems is widely characterized using anecdotal descriptors. `Forty percent of all failures are due to switch/connector problems' and `fifty percent of all equipment removed retests okay' are examples. While they are numerous and bear undeniable elements of truth, it is argued that their imprecision and fragmentary nature impede ready absorption of the ... View full abstract»

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  • The integrated support station (ISS): a modular Ada-based test system to support AN/ALE-47 countermeasure dispenser system testing, evaluation, and reprogramming

    Publication Year: 1989, Page(s):100 - 107
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (464 KB)

    The AN/ALE-47 countermeasures dispenser system (CMDS) is designed to be adaptive to new threat and user requirements. This adaptability is accomplished through software reprogramming of the system's operational flight program (OFP). An AN/ALE-47 system-peculiar integrated support station is used to verify the hardware changes at the system, line replaceable unit, and circuit card level, and to dev... View full abstract»

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  • Diagnostic tree design with model-based reasoning

    Publication Year: 1989, Page(s):161 - 167
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (484 KB)

    A reasoning procedure using quantitative models of connectivity and function has been developed to generate automatically multibranched diagnostic trees which can isolate faults within feedback loops and in the presence of multiple faults. The authors describe how the model-based reasoning system is used to generate automatically diagnostic trees that can have variable degrees of branching, from b... View full abstract»

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  • Measuring system performance characteristics of infrared systems (MRT, MTF, NETD) using automatic test equipment

    Publication Year: 1989, Page(s):236 - 241
    Cited by:  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (288 KB)

    A project is described whose goal is to develop and test image signal processing algorithms and techniques that allow automation of MRT (minimum resolvable temperature) testing. The basis of the automated test system is the premise that the system MTF (modulation transfer function) is a product of the MTFs of each subsystem component. The MTF of the lens and detector are the major factors affectin... View full abstract»

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  • Digital Maintenance Information (DMI) system

    Publication Year: 1989, Page(s):138 - 145
    Cited by:  Papers (4)  |  Patents (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (860 KB)

    The objective of the digital maintenance information (DMI) system is to improve the capabilities of maintenance organization by providing generic techniques with an integrated electronic deliverable information system for use with ATE (automatic test equipment). The system integrates multiple maintenance information sources into a single easy-to-use information system. Integrated diagnostics relat... View full abstract»

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