AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.

17-21 Sept. 1990

Filter Results

Displaying Results 1 - 25 of 82
  • Conference Record. AUTOTESTCON 90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment' (Cat. No.90CH2793-8)

    Publication Year: 1990
    Request permission for commercial reuse | PDF file iconPDF (750 KB)
    Freely Available from IEEE
  • Standardized Ada test constructs in a VXI bus implementation

    Publication Year: 1990, Page(s):247 - 254
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (696 KB)

    The work of the IEEE ABET (Ada-based environment for test) subcommittee in standardizing (as IEEE Std P1226) an environment for developing automated test programs in the Ada programming language is discussed. ABET will define standardized Ada mechanisms for implementing test programs with higher-level signal-oriented, UUT (unit-under-test)-directed test commands as defined by the ANSI/IEEE Std-716... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Ada software support environment for test

    Publication Year: 1990, Page(s):239 - 246
    Cited by:  Papers (2)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (532 KB)

    A standard test environment consisting of a test executive, an interface for instrumentation, and a bus handler is presented. The test executive provides a standard user interface, a hierarchical test menu structure that offers a high level of user control, and a flexible data recording system for both formatted and unformatted data. The instrument interfaces provide programming and user interface... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • GRADE: a graphical ATE desktop environment

    Publication Year: 1990, Page(s):231 - 238
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (500 KB)

    The GRADE (Graphical ATE Desktop Environment) operating shell, some requirements which prompted its design, and future enhancements are discussed. The objective of GRADE is to improve and standardize the user interface with automatic test equipment (ATE) while providing a platform that displays virtual instrumentation and allows paperless maintenance. The problem addressed in its development was h... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Interface Test Adapter Configurator

    Publication Year: 1990, Page(s):255 - 257
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (192 KB)

    A rule-based system for designing the interface test adapter (ITA) used in automatic testing of the circuit boards of an aircraft's components is described. The design task, known as ITA design, requires significant use of heuristic techniques. The system, called the Interface Test Adapter Configurator (ITA-C), written in Prolog and hosted on a PC, reads in the user-created data file of the test r... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A 0.5 to 20.0 GHz RF generator instrument-on-a-card using MMIC and field programmable gate arrays

    Publication Year: 1990, Page(s):115 - 121
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (388 KB)

    An instrument-on-a-card (IAC) has been developed which uses monolithic microwave integrated circuit technology and field programmable gate arrays to provide a ±20-dBm RF stimulus capability over the frequency range of 0.5 to 20.0 GHz. It is capable of being tuned in 0.15-Hz steps, in 200 μs per step. The entire frequency range can be swept in less than 1 s. Pulse and arbitrary amplitude ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Self-improving ATE

    Publication Year: 1990, Page(s):145 - 152
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (668 KB)

    The University of Louisville, under contract from the Naval Ordnance Station/Louisville (NOSL), was given the task of exploring the use of artificial intelligence to increase the efficiency of automated test equipment (ATE) used to diagnose faults in low-frequency analog/digital circuit card assemblies (CCA). The authors present an account of the realization of level 1 of a multilevel project orga... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A comprehensive design and maintenance environment for test program sets

    Publication Year: 1990, Page(s):223 - 230
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (508 KB)

    A software program called CoMETS (comprehensive design and maintenance environment for test program sets), which gives the test designer a powerful tool to develop test programs free from the encumbrances imposed by the test language and target tester, is discussed. CoMETS uses language-neutral graphical symbols to express the flow of a test sequence, detail the expression of individual tests, cre... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Advanced diagnostic architecture for JIAWG compliant designs

    Publication Year: 1990, Page(s):105 - 111
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (504 KB)

    An advanced diagnostic architecture which supports JIAWG (Joint Integrated Avionics Working Group) compliant designs is described. The hardware and software diagnostic components for achieving accurate localization of failures and the reestablishment of full system functionality are identified. It is noted that, in order to support the air-land battle concept for the next decade, advanced architec... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Support environment methodologies for the rapid reprogramming of operational flight programs

    Publication Year: 1990, Page(s):275 - 280
    Cited by:  Papers (2)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (520 KB)

    A description is given of the advanced multi-purpose support environment (AMPSE), a modular support environment used in testing, modifying, verifying, and validating operational flight programs (OFPs). It utilizes distributed processing with multiple common computers communicating over a high-speed real-time network. The hardware and software design uses a modular, building-block approach that has... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • VXI ATE technology

    Publication Year: 1990, Page(s):137 - 144
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (348 KB)

    Two VXI test sets are described. One is portable in the literal sense of the word, the other is transportable rather than portable. Each VXI card cage contains up to 13 instruments, including an onboard computer, in an area not much larger than two PCs stacked on top of each other. The capability of the portable tester rivals that of existing two- and three-rack ATE (automatic test equipment) and ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A flexible, MATE compliant portable test set

    Publication Year: 1990, Page(s):195 - 198
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (324 KB)

    A MATE compliant portable test unit that is based on the VME and VXI system architectures is presented. This standalone test set (SATS) is the central computer of the Bendix developed avionics test system for the A-7 Corsair. It has been designed with the flexibility to allow application-specific configurations. The incorporation of artificial-intelligence diagnostics and the ability to present on... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Implementing boundary scan test strategies

    Publication Year: 1990, Page(s):325 - 329
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (340 KB)

    Board-level boundary scan testing, focusing largely on the boundary scan EXTEST mode for structural testing of interconnects between boundary scan devices on a board and testing of conventional, nonscan components which cannot be accessed using traditional in-circuit or cluster test techniques, is dealt with. Strategies and test-nail placement for implementing various types of boundary scan testin... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Next generation TPS architecture

    Publication Year: 1990, Page(s):51 - 61
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (728 KB)

    The authors describe the symptom-model-based (SMB) approach, which correlates the failure symptom with the ambiguity group using historical data and diagnostic knowledge of the specific line replaceable units (LRUs). The SMB approach incorporates three key techniques for developing a next-generation TPS (test program set) architecture. The first technique is model-based diagnosis, which involves i... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • VLSI selftest as a `layer' of built-in test-a case study

    Publication Year: 1990, Page(s):215 - 219
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (416 KB)

    The testability problem for VLSI circuits is discussed. Guidelines for the inclusion of custom VLSI testability features into the built-in test (BIT) mechanization of an electronic systems design are presented along with some lessons learned from its actual incorporation into a completed electronics system. It is concluded that the impacts on cost and schedule resulting from a deficiency of VLSI t... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Massive monitoring: a methodology to ensure TLM effectiveness [avionics and weapon systems]

    Publication Year: 1990, Page(s):101 - 104
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (276 KB)

    The author examines the concepts of massive monitoring (MM) and two-level maintenance (TLM) and indicates that MM is an appropriate methodology for the realization of TLM. A simplified application example of a typical rudder-control subsystem is presented View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Integrated diagnostics from a concurrent engineering perspective

    Publication Year: 1990, Page(s):589 - 594
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (472 KB)

    Integrated diagnostics (ID) issues, drivers, problems, solutions, and implementation are discussed. It is concluded that budget cuts in the 1990s and the severity of the operational problems will force implementation of ID in the military. It is suggested that concurrent engineering will be the vehicle for ID implementation. ID as a key strategy for the implementation of concurrent engineering is ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A Navy approach to integrated diagnostics

    Publication Year: 1990, Page(s):443 - 450
    Cited by:  Papers (16)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (472 KB)

    The Naval Sea Systems Command (NAVSEA) is developing a framework for providing a total and integrated diagnostic capability for shipboard systems. This framework will consist of policies, standards, guides, and generic diagnostic software packages. A major part of this framework is the Navy Integrated Diagnostic Support System (IDSS). The IDSS is a research and development program to demonstrate t... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • ATE digital testing using a programmable microsequencer architecture

    Publication Year: 1990, Page(s):269 - 273
    Cited by:  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (276 KB)

    In the past, the digital testing of an aircraft's complex line replaceable units (LRUs) on large automatic test equipment (ATE) was handled by designing a special set of interface boards. As more and different LRUs were added to the aircraft, the test stations began to run out of room in the interface test adapter (ITA) patch panel. The solution was to design an interface board that uses a microco... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • The role of test instrumentation in integrated diagnostics and common testers

    Publication Year: 1990, Page(s):129 - 135
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (528 KB)

    The author examines the instrument hardware and programming environments and the role that recent advances in instrumentation can play in helping to achieve test system commonality. He considers the aspects of commonality that are affected by test equipment, the capabilities and limitations of the instrument environment, and the criteria affecting these abilities, including the differences and sim... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Intelligent test program evaluation

    Publication Year: 1990, Page(s):71 - 75
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (420 KB)

    An approach for the evaluation, verification, and validation of integrated family test equipment (IFTE) test program sets (TPS) using knowledge-based system technology has been developed for the US Army ARDEC, Picatinny Arsenal, NJ. The authors examine the TPS acceptance problem, which the expert system for TPS quality assurance (ESQA) was intended to solve, and how the system addresses various as... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Mechanical system condition monitor (MSCM) system design

    Publication Year: 1990, Page(s):543 - 548
    Cited by:  Papers (1)  |  Patents (3)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (304 KB)

    The interrelationship of mechanical system condition monitor (MSCM) design parameters with R&M (reliability and maintenance) and O&S (operation and support) cost parameters is established. Based on these relationships, a simple model that allows numerical estimates of required diagnostic attributes is developed in two parts. The proposed methodology relates support costs, mean time between... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • A mechanical system condition-based maintenance demonstration model [naval shipboard machinery]

    Publication Year: 1990, Page(s):529 - 533
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (320 KB)

    The increasing sophistication of naval shipboard machinery coupled with increasing competition for skilled manpower and tightening of defense budgets is forcing the Navy to consider alternative maintenance concepts. One such concept, condition-based maintenance (CBM), is described along with the reasons for its consideration. The concept of such a system integrated into the naval ship environment ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Mechanical diagnostics-past, present and future

    Publication Year: 1990, Page(s):517 - 521
    Cited by:  Papers (1)
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (384 KB)

    The background and current trends of the automatic diagnostics of mechanical systems are reviewed. Particular attention is given to a breakthrough in this field involving the introduction of the Mechanical Systems Diagnostic Analyzer in the late 1970s. Further advances in this field are also discussed, with particular emphasis on a reasonably expert system. Scientific-Atlanta's Rotor Analysis and ... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.
  • Airline get SMART for avionics testing

    Publication Year: 1990, Page(s):505 - 508
    Request permission for commercial reuse | Click to expandAbstract | PDF file iconPDF (308 KB)

    The authors present a technical overview of the SMART (Standard Modular Avionics Repair and Test) architecture and discuss some of the test program development and execution features which are expected to improve productivity and lower costs. SMART provides a standard interface for all SMART testers, instrument interchangeability, and a standard ATLAS test language for test programs. It is conclud... View full abstract»

    Full text access may be available. Click article title to sign in or learn about subscription options.